The Santec MPM-211 is a 4-channel optical power meter module engineered for simultaneous measurement of optical power across multiple channels in multichannel optical devices and components. This plug-in module integrates into Santec’s MPM-210H and MPM-210 mainframes to deliver high-precision power monitoring with extremely low polarization-dependent sensitivity. The InGaAs sensor element provides accurate measurements across the infrared spectrum, ideal for telecommunications, sensing, and component characterization applications requiring parallel channel acquisition.
Technical Specifications
• Channel Count: 4 channels per module
• Wavelength Range: 1250 to 1680 nm
• Power Measurement Range: −80 to +10 dBm
• Measurement Dynamic Range (typical): > 30 dB
• High Dynamic Range (Logging Mode): Typically 50 dB per scan
• Data Logging Capacity: Up to 1 million sampling points per port; 2 memory buffers per port
• Averaging Time: > 50 μs (gain 1, 2, or 3); > 100 ms (auto range mode)
• Sensor Element: InGaAs
• Polarization-Dependent Sensitivity: Extremely low
• Connector Type: FC
• Operating Temperature: 23±5 °C
• Operating Humidity: < 80% non-condensing
– Key Features
• High linearity across the measurement range
• Dual memory buffers per port enable continuous logging and data management
• Rapid averaging times support both fast transient capture and precision averaging modes
• Extreme insensitivity to polarization effects minimizes measurement uncertainty in real-world deployed fiber
– Typical Applications
• Multichannel optical power monitoring in wavelength-division multiplexed (WDM) systems
• Insertion loss and power distribution testing
• Component characterization in production and R&D environments
• Parallel channel measurements in swept-wavelength test configurations
– Compatibility & Integration
The MPM-211 module mounts within Santec MPM-210H or MPM-210 mainframes. System-level interfaces—GPIB, TCP/IP, and RS-232C—are provided by the host mainframe. Integration with Santec TSL-Series tunable lasers enables full swept-wavelength test automation for IL and PDL measurement workflows.
