The Santec TSL-510 is a tunable laser source engineered for telecommunications, optical component testing, and spectroscopy applications. It delivers continuous, mode-hop-free wavelength sweeps with high output power, low noise, and exceptional stability across a 130 nm tuning range. Four model types address diverse measurement requirements—from peak power performance to ultra-low ASE noise and integrated wavelength metrology.
Technical Specifications
Wavelength Range: Available in O-Band (1260–1360 nm), 1340–1440 nm, 1420–1520 nm, 1500–1630 nm, and 1560–1680 nm configurations. Full 130 nm tuning span within each band.
Sweep Speed: Up to 100 nm/sec.
Wavelength Accuracy: ±5 pm (Type C and Type D); <5 pm achievable with fine-tuning.
Wavelength Stability: ±1 pm over 1 hour, or within ±0.5 °C ambient variation.
Output Power: Type A/C models deliver ≥+13 dBm peak (1560–1680 nm range yields ≥+8 dBm for Type A/C, ≥−4 dBm for Type B/D; 1260–1360 nm Type D: ≥+2 dBm peak, ≥−2 dBm full-range).
Linewidth: Typically 40 MHz with coherence control enabled.
Fine-Tuning Resolution: <10 MHz (~<1 pm).
SSSER (Signal-to-Source Spontaneous Emission Ratio): ≥65 dB (Type B/D); ≥80 dB/0.1 nm (Type D, 1260–1360 nm).
Wavelength Resolution: 1 pm.
Optical Power Stability: ±0.01 dB.
– Key Features
• Mode-Hop-Free Operation: Continuous sweeps across full tuning range without spectral discontinuities.
• Coherence Control: Standard feature adjusts optical linewidth to suppress multi-reflection interference.
• Four Model Variants: Type A emphasizes peak power; Type B optimizes SNR (≥65 dB) for high-isolation DWDM filtering; Type C integrates wavelength meter (±5 pm accuracy); Type D combines Type B and Type C capabilities.
• Power Monitoring: Standard on Type D; optional on other models.
• Modulation: Low-frequency modulation standard; high-frequency modulation available.
– Typical Applications
• DWDM filter and optical component characterization
• Wavelength-dependent transmission and loss measurements
• Spectroscopic analysis and source spectral profiling
• High-resolution optical testing requiring mode-hop-free sweeps
