The Spirent TAS5100C is a precision channel and clock emulator engineered for laboratory validation of wireless devices and synchronization systems. This instrument simulates complex propagation environments and timing conditions, enabling rigorous testing of LTE, Synchronous Ethernet, and legacy telecom infrastructure under controlled, repeatable scenarios. The TAS5100C measures time interval error (TIE) and absolute time error (ATE), displaying results against industry-standard masks in real time.
Technical Specifications
Frequency Coverage & Signal Support
• Operating frequencies to 6 GHz
• LTE bands: TDD and FDD configurations
• Pre-defined clock types: 1 pps, 8 kHz, 64 kHz/64 kb/s, 1.544 MHz/1.544 Mb/s (T1/DS1), 2.048 MHz/2.048 Mb/s (E1), 5 MHz, 10 MHz, 25 MHz, 125 MHz, 156.25 MHz (SyncE), 34 Mb/s (E3), 45 Mb/s (DS3), 155.52 MHz/155 Mb/s (STM-1/STS-3)
• User-defined clock generation: 0.5 Hz to 200 MHz in 0.5 Hz steps (symmetrical, unipolar)
Measurement Ports
• 2 BNC ports per module
• Impedance: 75 Ω VSWR <2:1 or 1 MΩ
• Voltage range: ±5.00 V
• Minimum sensitivity: 60 mVpp
• Signal types: Symmetrical and unsymmetrical pulses, HDB3-coded data, AMI B8ZS, B3ZS data
Timing Performance
• 1 pps output from internal Rubidium oscillator
• TTL levels in 50 Ω
• TE measurement accuracy: ±75 ns (referenced to GNSS)
Test Modes & Masks
• TIE, MTIE, TDEV graph display with ~10 second update rate
• Overlay capability: up to 6 graphs with color coding
• Mask standards: PRC/SSU/SEC (ETSI 300 462-3), G.823, G.824, G.8261, G.8261.1, G.8262 (SyncE), ANSI DS1 and OC-N
• On-screen display: up to 6 MTIE/TDEV masks with Pass/Fail indication
– Key Features
• Multi-standard compliance testing for telecom and wireless systems
• Simultaneous overlay graphing for comparative analysis
• SyncE clock measurement conforming to G.8261 and G.8262
• Internal Rubidium timing reference
– Typical Applications
• LTE device and infrastructure validation
• Synchronous Ethernet performance verification
• T1/E1 and higher-order legacy circuit testing
• PTP clock recovery and stability measurement
• Network timing compliance verification
– Compatibility & Integration
Supports measurement of both clock and data signals across legacy (DS1, E1, E3, DS3) and modern (SyncE, PTP, LTE) standards. BNC and high-impedance inputs accommodate diverse test signal sources.
