The Sun Systems EC10 is a compact environmental test chamber engineered for automated test systems and laboratory temperature validation. It delivers a -184°C to 315°C operating range using liquid nitrogen, or -73°C to 315°C with liquid carbon dioxide, with temperature ramp rates of 30°C/min across a 0.7 cubic feet workspace. The chamber integrates the TC10 controller, featuring dual-channel temperature monitoring (chamber and device-under-test), programmable temperature profiles with ten set points, and full remote command capability via IEEE-488 and RS232/RS422 interfaces.
Technical Specifications
• Workspace Volume: 0.7 cubic feet
• Interior Dimensions: 12″ W × 9.75″ H × 10.25″ D
• Overall Dimensions: 21″ W × 16″ H × 24″ D
• Weight: 49 lbs
• Temperature Range: -184°C to 315°C (LN2); -73°C to 315°C (LCO2)
• Heat/Cool Rate: 30°C/min
• Airflow: 60 CFM vertical circulation
• Power Requirement: 1600 W at 110/220 VAC (50/60 Hz)
– Key Features
• TC10 controller with 2-line, 16-character LCD display and full-function keyboard
• BASIC-like programming language with non-volatile memory
• Ten programmable temperature setpoints with adjustable ramp rates and soak times (0.1 to 1800 minutes)
• Dual temperature probes: chamber and electrically isolated device-under-test monitoring
• Integrated probe calibration with open/short detection
• User-adjustable PID control coefficients
• Mechanically adjustable over-temperature thermostat with software limits and watchdog timer protection
• D/A outputs (0 to +5V or -5 to +5V) on four channels; auxiliary input and output provisions
• Power-down restart and temperature deviation limit control
– Typical Applications
Semiconductor device qualification, component thermal cycling, electronics reliability testing, and automated environmental validation in production and development environments.
– Compatibility & Integration
IEEE-488 (GPIB) and RS232/RS422 serial interfaces support integration with automated test systems. Front panel menu configuration enables alarm functions, sound level, and communication parameters adjustment.
