The Tektronix 11402 is a programmable digitizing oscilloscope mainframe engineered for high-performance signal acquisition and analysis across demanding measurement applications. Its plug-in modular architecture enables system customization with various 11000-series amplifiers, supporting configurations from eight channels at 300 MHz to three channels at 1 GHz. The instrument delivers up to 20 MS/s sampling rate through equivalent-time digitizing for repetitive signals, with 10-bit vertical resolution upgradeable to 14 bits using averaging. Waveform records contain up to 10,240 points, configurable from 512 to 10,240 points per record.
Technical Specifications
• System Bandwidth: 1 GHz
• Trigger Bandwidth: 1 GHz
• Maximum Sampling Rate: 20 MS/s (equivalent-time digitizing)
• Channels: Up to 8 channels of display and acquisition (configuration-dependent)
• Vertical Resolution: 10 bits; 14 bits with averaging
• Waveform Record Length: 512 to 10,240 points per record
• Display: 9″ monochrome CRT with touch screen (color CRT available on 11403 variant)
– Key Features
• Flexible triggering with multiple source, mode, and slope selections for complex signal synchronization
• Advanced waveform processing: differentiate, integrate, interpolate, smooth, average, and envelope functions
• Automatic pulse parameter measurement and statistical analysis
• Arithmetic operators: add, subtract, multiply, divide, square root, log, exponentiate, absolute value, and signum
• Accepts differential, high-impedance, and 50 Ω input amplifiers
• Full programmability via GPIB (IEEE-488) and RS-232C
• Option 4D DMA controller for increased GPIB transfer speed and system throughput
– Typical Applications
Analog and digital circuit characterization, repetitive signal analysis, pulse parameter extraction, and integrated test automation requiring multi-channel simultaneous acquisition.
– Compatibility & Integration
Plug-in modularity accepts three 11000-series plug-in amplifiers. GPIB and RS-232C interfaces enable direct integration into automated test environments. DMA controller option enhances data transfer efficiency for high-throughput applications.
