The Tektronix 11802 is a high-bandwidth digital sampling oscilloscope designed for precise capture and analysis of high-speed signals in research, development, and test environments. This dual-channel mainframe accommodates two 11800 series plug-in sampling modules and delivers up to 20 GHz bandwidth with equivalent-time sampling intervals of 10 femtoseconds, enabling detailed signal characterization across demanding applications.
Technical Specifications
Bandwidth & Sampling
• Bandwidth: Up to 20 GHz (sampling head dependent); 5 GHz with built-in delay lines (50% attenuation)
• Maximum Sample Rate: 200 kHz
• Equivalent-Time Sampling Interval: 10 femtoseconds (0.01 ps)
• Vertical Resolution: 8 bits full screen (80 µV LSB at 2 mV/div)
• Record Length: 512, 1024, 2048, 4096, 5120 samples
Trigger System
• Trigger Bandwidth: 1 GHz
• DC Coupled Sensitivity: 50 mV p-p (DC to 100 MHz); 150 mV p-p (to 800 MHz); 250 mV p-p (at 1 GHz)
• AC Coupled Sensitivity: 50 mV p-p (10 kHz to 100 MHz); 150 mV p-p (at 1 GHz)
• Delay Jitter: 5 ps + 20 ppm of selected delay (RMS)
• Trigger Level Range: ±1.0 V (±5.0 V with 10X attenuator)
• Pretrigger Capability: Up to 5 ns via internal pickoff in delay lines
Waveform Display & Analysis
• Window Capability: Up to eight displayed traces with independent positions and edge tracking
• Processing Functions: Add, subtract, multiply, divide, absolute, average, differentiate, envelope, exponent, integrate, natural log, log, signum, square root, smoothing, filter
• Measurements: Max, min, mid, p-p, mean, RMS, rise, fall, frequency, period, propagation delay, cross, width, area, energy; mean and standard deviation continuous calculation
• Cursor Options: Paired or split dots, vertical bars, horizontal bars
Time Domain Reflectometry
• Compatible with SD-24 Dual-Channel TDR/Sampling Head
• Bandwidth: 2 GHz acquisition and TDR
• Polarity-selectable step generators (positive/negative)
• Reflected Risetime: 35 ps
– Key Features
• Four-channel architecture via dual 11800 series modules
• Flexible window acquisition with independent resolution enhancement
• Internal pretrigger pickoff for low repetition rate signal analysis
• Full waveform processing and statistical measurement capabilities
– Typical Applications
High-speed digital circuit characterization, signal integrity analysis, TDR measurements, and transient capture in research and manufacturing test environments.
– Compatibility & Integration
Accommodates 11800 series sampling heads. Integrates with SD-24 TDR/sampling head for extended measurement capability.
