The Tektronix AFG320 is a dual-channel arbitrary function generator engineered for signal generation across telecommunications, semiconductor testing, and research applications. It integrates five core capabilities—function generator, arbitrary waveform generator, burst generator, sweep generator, and modulation source—into a single instrument. Independent or synchronized channel outputs enable flexible testing configurations with precise waveform control.
Technical Specifications
Channels & Frequency Range
• 2 independent channels
• Sine, Square: 0.01 Hz to 16 MHz
• Triangle, Ramp, Pulse: 0.01 Hz to 100 kHz
• Gaussian Noise: maximum 8 MHz bandwidth
• Arbitrary Waveform Repetition: 0.01 Hz to 1.6 MHz
Waveform Generation
• Vertical Resolution: 12 bits
• Sample Rate: 16 MS/s
• Arbitrary Waveform Length: 10 to 16384 points
• Non-volatile Memory: four 16k-point waveforms
Output Specifications
• Amplitude (50 Ω): 50 mVp-p to 20 Vp-p
• Amplitude Accuracy: ±(1% of setting + 5 mV) at 1 kHz
• Flatness (1 V amplitude, 1 kHz reference): ±1% (<100 kHz), ±1.5% (100 kHz–1 MHz), ±3% (1–16 MHz)
• Output Impedance: 50 Ω
• Offset Range: –0.75 V to +0.75 V (50–500 mVp-p); limited to ±5 V peak (505 mVp-p–10 Vp-p)
• Offset Accuracy: ±(1% of setting + 5 mV)
• Offset Resolution: 5 mV
• Phase Range: ±360°; Resolution: 1°
• Ground Isolation: 42 V peak maximum
– Standard Waveforms
Sine, Square, Triangle, Ramp, Pulse, DC, Gaussian Noise, Sin(x)/x. Four preprogrammed user-defined waveforms: Sin(X)/X, Double Exponential Pulse, Damped Sine Wave, NRZ Random Signal.
– Modulation Capabilities
AM: External source; carrier to 16 MHz; modulation 0.01 Hz to 200 kHz; 100% depth at 2 Vp-p.
FM: Internal sine, square, triangle, or arbitrary modulation; 0.01 Hz to 10 kHz; deviation 0.01 Hz to 8 MHz.
FSK: Internal trigger or burst mode; 0.01 Hz to 16 MHz; key rate 0.01 Hz to 50 kHz; 2 keys.
Burst: Specified cycle count per trigger; carrier to 1 MHz or 16 MHz.
– Typical Applications
Telecommunications signal simulation, semiconductor device characterization, complex waveform design verification, and modulated signal testing.
