Tektronix P7380

The Tektronix P7380 differential probe is engineered to provide exceptional signal acquisition for high-speed measurements. With its wide bandwidth, it accurately captures fast transient signals and high-frequency components. The probe’s low input capacitance minimizes loading effects on the circuit under test, ensuring accurate measurements. Its differential architecture effectively rejects common-mode noise, improving signal integrity. The P7380 offers versatile connectivity options, allowing it to be easily adapted to different testing environments and devices.