Tektronix TDS7254B Digital Oscilloscope, 2.5GHz, 4-Ch.

The Tektronix TDS7254B is a 2.5 GHz, 4-channel digital oscilloscope built for high-speed signal analysis, jitter characterization, and compliance testing of serial data streams. It combines 20 GS/s real-time sampling, 64 MB acquisition memory, and DPX acquisition technology delivering over 400,000 waveforms per second—enabling capture of transient events with 43 ps rise time resolution. The instrument provides advanced triggering, spectral analysis, clock recovery up to 3.125 Gb/s, and optional jitter analysis software, making it essential for signal integrity verification and design debug in telecommunications, datacom, and storage applications.

Technical Specifications

• Analog Bandwidth: 2.5 GHz
• Real-Time Sample Rate: 20 GS/s maximum
• Waveform Capture Rate: >400,000 wfms/s (DPX acquisition)
• Rise Time (20%–80%): 43 ps
• Analog Input Channels: 4
• Maximum Record Length: 64 MB (up to 16M points per channel)
• Display: XGA 1024×768 color, touch-sensitive or mouse-navigable

– Key Features

• Digital Phosphor Oscilloscope (DPO) technology with superior measurement fidelity
• MultiView Zoom navigation for extended acquisition records
• Advanced triggering: sequential, delayed, mask-based, and serial pattern triggers (Option SM)
• Communications mask testing up to 4.25 Gb/s
• Clock recovery from serial data streams up to 3.125 Gb/s
• Multiple auto-measurements with exceptional delta-time accuracy
• Spectral analysis and optional jitter analysis (Option JA3, JE3)
• Power measurement and analysis software (Option PW3)
• Trigger holdoff and coupling control

– Typical Applications

• Signal integrity, jitter, and timing analysis
• Compliance testing of serial data up to 4.25 Gb/s
• Transient event capture and characterization
• High-speed design verification and debugging
• Telecommunications and datacom system validation

– Compatibility & Integration

The TDS7254B supports multiple trigger sources and modes, enabling synchronization with external test equipment and automated measurement workflows across complex digital designs.