The Tektronix TVS625 is a VXI-based waveform analyzer delivering 2-channel simultaneous signal acquisition at 1 GS/s across a 250 MHz bandwidth. Purpose-built for high-speed transient capture and signal integrity analysis, the TVS625 combines real-time digitization with advanced waveform processing—FFT analysis, automated measurements, waveform math, and template/limit testing—enabling rapid characterization of complex electronic phenomena in automated test environments.
Technical Specifications
Acquisition Performance
• Bandwidth: 250 MHz
• Sampling rate: 1 GS/s simultaneous on both channels
• Sample interval: As short as 200 ps/point in real-time mode
• Acquisition memory: 15,000 samples (real-time), 30,000 samples (extended real-time)
• Input impedance: Switchable 1 MΩ or 50 Ω
• Voltage sensitivity: 10 mV to 100 V full scale
• Input coupling: DC, AC, or Off
• Selectable input filters: Full, 250 MHz, or 20 MHz bandwidth
• Channel delay: < 100 ps (matched input range and coupling)
• Fiducial input: < 2.5 ns rise time on channel 1
Triggering
• Internal modes: Main, delayed, edge, and pulse triggering
• Trigger sources: Input channels, external trigger input, VXI backplane
• Delay options: By time or by events (1 to 10,000,000 events, 250 MHz max rate)
• Trigger modes: Normal, Single, or Auto
Waveform Analysis
• FFT analysis, waveform math, and automated measurements
• Acquisition modes: Auto-advance with time-stamping, envelope, average
• Template, measurement limit, and zoned waveform testing
– Key Features
• Single-shot capture of transient events across dual channels
• Time-stamped auto-advance for rapid event sequence analysis
• Fast calculation engine for real-time measurements and transforms
• Extensive SCPI command set and message-based programming interface
– Typical Applications
Signal integrity characterization, transient event capture, complex waveform troubleshooting, and automated production test environments requiring deterministic, simultaneous multi-channel acquisition.
– Compatibility & Integration
VXI instrument with full SCPI programmability for integration into automated test systems.

















