The VXI Technology VM7004 is a 4-channel programmable resistor module engineered for integration into VXIbus test systems. Part of the VMIP family, it occupies a single VXI C-size card slot and supports up to three modules per slot for 12 independent channels. Four-wire connections per channel eliminate connector and wiring resistance errors, while an integrated four-wire monitor bus enables direct access to any resistor for calibration and self-test. The module operates in individual, potentiometer, parallel, and series modes to meet diverse measurement requirements.
Technical Specifications
• Programmable Resistance: 0 Ω to 16 MΩ (standard range 0 to 16,383 Ω; extended options to 16,383,000 Ω)
• Step Size: 1 Ω single channel; 0.5 Ω two channels parallel; 0.25 Ω four channels parallel
• Accuracy: ±0.02% of programmed value ± 0.5 Ω (standard range)
• Thermal Offset: ≤ ±25 µV
• Programming Speed: Up to 500 settings/second
• Relay Setting Time: 2 ms inclusive
• Scan List Capacity: 256 values per channel
• Programmable Delay: 0 to 655 ms
• Connector: 25-pin female high-density DSUB
• Carrier: Requires VM9000 carrier for VMIP operation
– Key Features
• Four-wire per-channel connections reduce measurement uncertainty from lead resistance
• Four-wire monitor bus provides single-port access to all four resistors
• Message-based (SCPI/IEEE-488.2) and register-based data access for optimized throughput
• On-board triggering with external device and VXIbus card triggering capability
• VXIplug&play drivers supplied for rapid system integration
• Flexible operating modes: individual channel, potentiometer, parallel, and series configurations
– Typical Applications
• RTD and sensor simulation
• Process control instrumentation
• Automated Test Equipment (ATE) calibration
• Station self-test and verification
– Compatibility & Integration
The VM7004 integrates into any VXIbus C-size slot system via the VMIP platform with VM9000 carrier support. Multiple modules cascade within a single slot for high-density test solutions. Register-based access delivers maximum throughput for high-speed production test environments.
