The Wiltron 3680V is a universal test fixture engineered for precision characterization of microstrip and coplanar waveguide (CPW) devices across DC to 60 GHz. It provides accurate, repeatable transitions from V Connector® coaxial interfaces to on-substrate devices, enabling comprehensive measurement of microwave components in production and R&D environments. The fixture accommodates substrates up to 2 inches in length and 5 to 75 mil thickness, with ±0.5 inch line offset capability—eliminating the need for custom center sections across different device geometries.
Technical Specifications
Electrical Performance:
• Frequency Range: DC to 60 GHz
• Repeatability: ±0.1 dB (DC to 20 GHz), ±0.20 dB (20 to 40 GHz), ±0.30 dB (40 to 60 GHz)
• Return Loss: >17 dB (DC to 20 GHz), >14 dB (20 to 40 GHz), >8 dB (40 to 60 GHz)
Mechanical Specifications:
• Substrate Length Capacity: Up to 2 inches (50 mm)
• Substrate Thickness: 5 mil to 75 mil (0.12 mm to 1.9 mm)
• Line Offset Accommodation: ±0.5 inches (±12.7 mm)
• Overall Dimensions: Approximately 4 × 5 × 2.5 inches (W × L × H)
– Key Features
• Spring-loaded jaw mechanism ensures consistent electrical contact across measurement cycles
• Dielectric spacers reduce fringing capacitance, improving accuracy and repeatability
• Solid top and bottom ground contacts for microstrip or CPW measurements
• Universal adjustability supports inline, parallel, and offset line configurations without fixture reconfiguration
• Resolution capability of 1.2 mm discontinuity detection on alumina substrates
• Optional right-angle launcher accessory (Model 36801V) enables multi-port and 90° measurements
• Optional bias probes (Model 36803) for on-substrate power injection or device biasing
• Optional MMIC attachment (Model 36802) for miniature uncarried substrate testing
• Time domain capability option for 60 GHz time or distance measurements with high resolution
• Microstrip dispersion compensation when used with compatible Anritsu VNA systems
– Compatibility & Integration
The fixture operates with both vector network analyzers (VNA) and scalar network analyzers. It supports Open-Short-Load (OSL) and Line-Reflect-Line (LRL) calibration methodologies for microstrip and CPW substrates, enabling integration into automated and manual test workflows.
