The Yokogawa DL1740EL is a 4-channel digital oscilloscope delivering 500 MHz analog bandwidth and 1 GS/s maximum sampling rate for detailed signal analysis across complex waveforms. Its 8 MW memory depth enables extended observation intervals without sampling rate degradation, while the 6.4-inch color TFT LCD (640×480 resolution) provides real-time waveform visualization at up to 60 screens/second.
Technical Specifications
Acquisition & Triggering
• Analog Bandwidth: 500 MHz
• Maximum Sampling Rate: 1 GS/s
• Memory Depth: 8 MW (Megawords)
• Channels: 4 analog
• Display: 6.4-inch TFT color LCD, 640×480 pixels full resolution, 500×384 waveform display
• Screen Update Rate: Up to 60 screens/s (10-KW mode)
• Acquisition Modes: Normal, Averaging, Envelop, Box Average
• Trigger Modes: AUTO, AUTO-LEVEL, NORMAL, SINGLE, SINGLE (N)
Input Specifications
• Input Impedance: 1 MΩ ±1.0% (AC/DC coupling) or 50 Ω ±1.0% (DC coupling)
• Input Coupling: AC, DC, GND
• Vertical Sensitivity (1 MΩ): 2 mV/div to 10 V/div
• Vertical Sensitivity (50 Ω): 2 mV/div to 1 V/div
• Maximum Input Voltage (1 MΩ): 400 V DC + AC peak / 282 Vrms CAT II (≤1 kHz)
• Maximum Input Voltage (50 Ω): 5 Vrms / 10 V peak
• Input Filter: Selectable 100 MHz or 20 MHz per channel
– Key Features
• Extended memory depth for transient capture without rate compromise
• Dual input impedance architecture (1 MΩ and 50 Ω) with independent coupling control
• CAT II-rated high-voltage measurement capability on 1 MΩ channels
• Selectable bandwidth limiting reduces noise in low-frequency analysis
– Interfaces & Integration
• External Trigger: 0 to 100 MHz input
• External Clock: 40 Hz to 20 MHz
• Trigger Gate Input for external control
• TTL Output: GO/NO GO results and trigger signals
• Video Output: External monitor connectivity
• Networking: 100BASE-TX and 10BASE-T Ethernet
• Legacy Support: USB Ver. 1.0, PC Card, SCSI, Serial
• Probe Power Supply: Accepts Yokogawa FET probes and current probes
– Typical Applications
General-purpose analog signal measurement, multi-channel waveform acquisition, transient analysis, and high-voltage circuit diagnostics in industrial and automotive test environments.
