The Yokogawa GS820 Multi Channel Source Measure Unit delivers dual isolated channels for simultaneous four-quadrant sourcing and measurement of voltage and current. Each channel integrates constant voltage and current sources with independent voltmeter and ammeter functions, enabling both source and sink operation. The instrument generates 5.5-digit measurement resolution and supports arbitrary waveform generation up to 100,000 points at 100 µs intervals, making it suitable for semiconductor testing, LED characterization, and component evaluation in production and laboratory environments.
Technical Specifications
Channel Configuration & Measurement
• 2 isolated analog channels with integrated VS, IS, VM, and IM functions
• 5.5-digit resolution for output and measurement
• Configurable measurement integration time from 0.001 PLC to 25 PLC
• Auto zero measurement function for real-time offset correction
• Two-wire or four-wire voltage sensing via local or remote sense switching
18V Model (765601/02)
• Voltage ranges: 200 mV, 2 V, 7 V, 18 V
• Output current: ±3.2 A (at ±7 V or less), ±1.2 A (at ±18 V or less)
• Current ranges: 200 nA to 3 A across nine selectable ranges
• Maximum output voltage: ±18 V (at ±1.2 A or less), ±7 V (at ±3.2 A or less)
50V Model (765611/12)
• Voltage ranges: 200 mV, 2 V, 20 V, 50 V
• Output current: ±1.2 A (at ±20 V or less), ±0.6 A (at ±50 V or less)
• Current ranges: 200 nA to 1 A across nine selectable ranges
• Maximum output voltage: ±50 V (at ±0.6 A or less), ±20 V (at ±1.2 A or less)
– Key Features
• Arbitrary waveform generation with up to 100,000 points at 100 µs intervals
• Master-slave synchronization for channel expansion to 10 channels
• Preset and programmable sweep functions (continuous, linear, log)
• 16-bit digital I/O on models 765602/12
• Zero generation function for controlled load disconnection without chattering
• Separate generation and measurement trigger sources with constant period timer and external input options
• 256 × 64 dot matrix VFD display
• USB connectivity
– Typical Applications
• Semiconductor characterization and production testing
• LED device evaluation
• Electronic component qualification
• Automated test environments requiring fast measurement speeds
– Compatibility & Integration
Master-slave channel synchronization enables multi-channel test configurations up to 10 channels. USB connectivity supports integration with PC-based automated test systems.
