The Advantest Q8384 is an optical spectrum analyzer designed for high-performance characterization of optical signals across the 600 nm to 1700 nm wavelength band. It delivers the wavelength accuracy, resolution, and dynamic range required for telecommunications, optical device manufacturing, and research-grade spectral analysis. The instrument provides direct input handling up to +23 dBm (200 mW) and achieves level accuracy of ±0.4 dB at 1550 nm, making it suitable for EDFA noise figure measurement, WDM analysis, and optical filter evaluation.
Technical Specifications
• Wavelength Range: 600 nm to 1700 nm
• Wavelength Resolution: 10 pm (0.01 nm)
• Wavelength Accuracy: ±0.01 nm; 20 pm at 1.55 µm (with built-in calibration source); ±40 pm in L-band (1570–1610 nm)
• Wavelength Linearity: ±10 pm (1530–1570 nm)
• Wavelength Repeatability: ±3 pm (1530–1610 nm)
• Input Power Range: -60 dBm to +20 dBm; direct input to +23 dBm (200 mW)
• Input Power Accuracy: ±0.5 dB at 1550 nm
• Level Accuracy: ±0.4 dB at 1550 nm
• Level Linearity: ±0.05 dB (-50 dBm to -10 dBm, at 1550 nm)
• Dynamic Range: >50 dB at ±0.1 nm; 60 dB at ±0.2 nm; >70 dB overall
• Polarization Dependency: <±0.05 dB (1250–1610 nm)
• Sweep Time: <500 ms (10 nm span, normal mode, 1550 nm, 501 samples)
• Dimensions: 426 mm (W) × 133 mm (H) × 545 mm (D)
• Weight: 18 kg
– Key Features
• EDFA noise figure measurement with automatic calculation
• Optical frequency display aligned to ITU-T standardized wavelength grid
• WDM analysis with simultaneous display of up to 256 peak wavelengths and power levels
• Limit line function with Pass/Fail judgment for manufacturing line integration
• Alternate sweep function for dual-window comparison of measurement datasets
• Wavelength-specific S/N ratio analysis
• Broad-band EE-LED light source for narrow-band optical filter characterization
• Optional built-in wavelength calibrator (1550 nm EE-LED)
– Typical Applications
• EDFA and optical amplifier characterization
• WDM system analysis and channel power measurement
• Optical component and device testing in manufacturing environments
• Transmission and loss evaluation of optical filters
• ITU-grid frequency verification and optical signal integrity assessment
– Compatibility & Integration
• GPIB interface
• Ethernet connectivity
