The Advantest Q8341 is a benchtop optical spectrum analyzer for precise measurement and analysis of optical spectra across the visible and near-infrared range. Operating from 350 nm to 1000 nm, it employs Fourier spectroscopy with a Michelson interferometer architecture to deliver coherence measurements and peak wavelength identification. A built-in He-Ne laser provides wavelength reference, ensuring traceable accuracy across the measurement range.
Technical Specifications
• Wavelength Measurement Range: 350 nm to 1000 nm
• Measurement Principle: Michelson interferometer with Fourier spectroscopy
• Wavelength Resolution: 0.05 nm at 650 nm (standard); 0.01 nm at 650 nm (optional)
• Peak Wavelength Measurement Resolution: 0.001 nm
• Wavelength Measurement Accuracy: ±0.05 nm (standard); ±0.01 nm (optional)
• Coherence Measurement Resolution: 0.001 mm
• Maximum Coherence Measurement Length: 10 mm (standard); 40 mm (optional)
• Maximum Input Level: ±10 dBm
• Measurement Speed: 0.5 seconds fast sweep (optional)
• Internal Wavelength Reference: He-Ne laser
• Display: 6.5-inch color LCD, 640 × 480 resolution
• Dimensions: 424 mm (H) × 132 mm (W) × 500 mm (D)
• Weight: 15 kg
– Key Features
• Sub-nanometer wavelength resolution enables precise spectral characterization of laser diodes, including CD/DVD and blue-violet types
• Fourier spectroscopy with Michelson interferometer provides coherence and spectral phase information
• Fast measurement speed supports efficient thermal characterization and dynamic testing
• Dual-range coherence measurement accommodates short and extended optical path length analysis
– Environmental & Power
• Operating Temperature: +10°C to +40°C
• Storage Temperature: −10°C to +50°C
• Relative Humidity: 85% maximum operating (non-condensing); 90% maximum storage (non-condensing)
• Power Supply: 100–120 VAC / 220–240 VAC, 50/60 Hz, ≤150 VA; automatic voltage switching
– Typical Applications
Laser diode characterization, optical coherence analysis, spectral purity assessment, and temperature-dependent optical property evaluation.
