The Advantest TQ8215 Optical Power Multimeter is a benchtop instrument that combines optical power measurement with multifunction electrical testing capabilities. It delivers accurate fiber optic system characterization through integrated optical sensors, autoranging measurement, and real-time data analysis functions. The unit supports research, production, and system integration environments with both AC mains and battery operation.
Technical Specifications
Optical Measurements
• Wavelength range: 0.8 to 1.6 µm
• Wavelength display resolution: 0.01 nm
• Direct measurement capability: Up to 50 mW (laser diode measurement without attenuator)
• Power types measured: Average power, peak power
• Absolute accuracy: ±20 dBm (±0.25 dB at 1310 nm)
Electrical Measurements
• DC voltage measurement
• DC current measurement
• Resistance measurement
• Temperature measurement
• A/D converter accuracy: ±0.1% (including sensor measurement accuracy)
Display & Sampling
• 4½-digit display with wide dynamic range
• Sampling rate: 10 samples per second
• Autoranging with manual operation available
Functional Capabilities
• Measurement hold and manual triggering
• Scaling, percentage deviation, averaging, and max/min value display
• Smoothing function for measurement stability
• Demodulation functions enabling waveform monitoring via oscilloscope
• Analog monitor function
• Wavelength sensitivity compensation with automatic internal calibration (CFnm mode)
• Excellent linearity and temperature stability
Power Supply
• AC 100V mains operation (Japanese specification)
• Optional battery operation: Internal Ni-Cd battery pack with ≥10 hours continuous run time; rechargeable via AC adapter
– Key Features
• Compatible sensors: Silicon photodiodes (short wavelength), germanium or InGaS photodiodes (long wavelength); includes Q82014A, Q82017A (thin optical sensor), and Q82021A
• Optional GPIB interface for system integration
• Portable battery-powered outdoor operation capability
– Typical Applications
Research and development, production line testing, optical system integration, laser diode characterization.
