The Agilent E5100B is a 300 MHz high-speed network analyzer engineered for precise low-frequency impedance and S-parameter measurements across R&D and production environments. Operating from 10 kHz to 300 MHz, the instrument delivers sweep speeds as fast as 0.04 ms/point and dynamic range exceeding 100 dB, making it ideal for high-throughput component characterization.
Technical Specifications
• Frequency Range: 10 kHz to 300 MHz
• Measurement Speed: 0.04 ms/point (30 kHz IFBW, ramp-sweep)
• Dynamic Range: >100 dB (E5100B)
• IF Bandwidth: 10 Hz to 30 kHz, configurable in 1, 1.5, 2, 3, 4, 5, and 8 step increments
• Measurement Parameters: Gain (amplitude ratio), phase, group-delay, amplitude, gain-phase, gain-delay, impedance, admittance
• Input Impedance: 50 Ω nominal (standard); 50 Ω / 1 MΩ, 30 pF (optional)
• Output Power Range: –9 dBm to +11 dBm (standard); –48 dBm to +22 dBm (optional)
• Points per Sweep: 401
• Channels: 4
• Power Requirements: 90–132 VAC or 198–264 VAC, 47–63 Hz, 400 VA max.
– Key Features
• High dynamic range performance enables detection of weak signals and loss measurement in complex networks
• Configurable IF bandwidth from 10 Hz to 30 kHz optimizes measurement speed versus noise performance
• Four-channel architecture supports multi-port device characterization
• Extended output power range option (–48 dBm to +22 dBm) addresses low-level and high-power applications
• Parallel I/O (TTL, 16-bit output, 8-bit input/output) with optional opto-isolation for production integration
• IBASIC programming support with floppy disk and non-volatile memory storage
– Typical Applications
Filters, resonators, matching networks, and transmission-line characterization in manufacturing and design validation. Fast sweep times enable high-volume production testing of passive and active RF components.
– Compatibility & Integration
Works with the 41901A SMD PI-Network Test Fixture and E5090A 2-Port Transmission/Reflection Test Kit. Compact footprint: 177 mm (H) × 425 mm (W) × 425 mm (D); 12 kg.
