The Advantest Q7770 Optical Network Analyzer delivers comprehensive vector characterization of optical transmission systems through simultaneous amplitude and phase measurements across multiple channels. Purpose-built for DWDM system evaluation and optical component characterization, this instrument provides the precise vector measurements required to validate signal integrity and performance compliance in high-speed optical networks.
Technical Specifications
Measurement Capabilities
• Amplitude and phase analysis across multiple optical channels
• Precise vector measurements for signal integrity assessment
• S-parameter measurements including S11, S21, S12, S22 for 2-port devices; extended support for 3-port and 4-port configurations
• Parameter conversion to impedance (Z) and admittance (Y) parameters
Display & Analysis Formats
• Rectangular coordinates: amplitude (linear/log), phase, group delay, VSWR, complex number representation (real/imaginary)
• Smith Chart: marker reading with linear/logarithmic amplitude, phase, complex notation, R + jX, and G + jB formats
• Polar coordinates: amplitude, phase, and complex number display options
– Key Features
Multi-channel optical analysis enables simultaneous characterization of wavelength-division multiplexed signals without sequential measurement overhead. Vector measurement capability captures both magnitude and phase relationships critical for evaluating modulation fidelity and transmission linearity. Support for impedance and admittance conversion allows direct analysis of component characteristics without post-processing calculations.
– Typical Applications
• Dense Wavelength Division Multiplexing (DWDM) system performance validation
• Optical component characterization including filters, amplifiers, and modulators
• Signal integrity assessment in coherent optical communication systems
• Multi-port optical device evaluation
– Compatibility & Integration
The analyzer accommodates 2-port, 3-port, and 4-port optical device testing. Parameter conversion functions enable direct impedance and admittance analysis, supporting both traditional network parameter workflows and specialized optical measurement requirements.
