The Agilent/Keysight E8364B is a 50 GHz PNA network analyzer engineered for high-frequency component and system characterization. It delivers S-parameter, time-domain, and power measurements with exceptional speed and dynamic range, supporting up to 32 independent measurement channels with 16,001 points per channel. Measurement speed reaches less than 26 microseconds per point, while trace noise remains below 0.006 dB at 1 kHz IFBW. The analyzer extends to 110 GHz with external test heads and operates from a 10 MHz base frequency. Its 8.4-inch color LCD display accommodates up to 16 windows with 4 traces per window and 10 markers per trace.
Technical Specifications
• Frequency Range: 10 MHz to 50 GHz (extendable to 110 GHz with external test heads)
• Dynamic Range: 125 dB at 20 GHz; 104 dB at 50 GHz
• Output Power: 10 dBm maximum
• Measurement Speed: Less than 26 microseconds per point
• Trace Noise: Less than 0.006 dB (1 kHz IFBW)
• IF Bandwidth: 1 Hz to 40 kHz nominal; 10 Hz standard; 1 kHz trace noise setting
• Data Capacity: Up to 16,001 points per channel; 32 independent measurement channels
• RF Connectors: 3.5 mm male, 50 Ω
• Display: 8.4-inch color LCD, 640 × 480 resolution; 16 windows maximum; 4 traces per window; 10 markers per trace
• Processing: Intel 1.1 GHz Pentium M; 1 GB RAM
• Power Supply: 50/60/400 Hz (100–120 V); 50/60 Hz (220–240 V); auto-switching
• Power Consumption: 350 W
• Weight: 29 kg
– Key Features
• Comprehensive calibration support: TRM/LRM for on-wafer, in-fixture, and waveguide measurements
• Advanced calibration options: guided calibration, electronic calibration (ECal), vector-mixer calibration (VMC), scalar-mixer calibration (SMC), adapter removal, unknown thru, data-based standards
• Pulsed-RF and power measurements for linear and nonlinear characterization
• Mixer measurements including conversion loss, return loss, isolation, and absolute group delay
• Frequency-offset capability for mixer and amplifier analysis
• Time-domain analysis available as Option 010
– Typical Applications
• On-wafer and in-fixture component measurement
• High-power amplifier characterization
• Gain compression and harmonic analysis
• Intermodulation distortion (IMD) testing
• Waveguide component evaluation
• Mixer and frequency converter analysis
