The Agilent HP Keysight E5052A Signal Source Analyzer delivers precision phase noise and transient measurements across RF and microwave frequencies. This instrument characterizes crystal oscillators, VCOs, SAW oscillators, DROs, YIG oscillators, PLL synthesizers, RFICs, and LO circuits with high sensitivity and accuracy. The E5052A supports configurable frequency coverage from 10 MHz to 7 GHz, 26.5 GHz, or 110 GHz depending on the selected option.
Technical Specifications
Frequency Coverage
• Phase noise measurement: 10 MHz to 7 GHz with four dedicated bands (10 M–41 MHz, 39 M–101 MHz, 99 M–1.5 GHz, 300 M–7 GHz)
• Offset frequency range: 1 Hz to 40 MHz (standard) for carriers >400 MHz; 1 Hz to 20 MHz for 39–99 MHz carriers; 1 Hz to 5 MHz for 10–39 MHz carriers
• Frequency tracking: ±0.4% of carrier frequency
• Time resolution: 10 nanoseconds to 160 microseconds (transient mode)
• Frequency resolution: 5 Hz to 7 kHz (heterodyne mode)
Phase Noise Performance
• Cross-correlation method with 1 to 10,000 correlations for sensitivity enhancement
• Built-in LO optimization: 150 kHz (far-out)
• Spurious level: 65 dBc typical at >1 kHz offset
• Measurement accuracy: ±4 dB (1–1 kHz offset), ±2 dB (1 kHz–1 MHz), ±3 dB (1–40 MHz offset)
• IF gain: 0, 10, 20, 30, 40, 50 dB standard; 0, 10, 20 dB (Option E5052A-011)
Input and Signal Specifications
• Input level: −15 to +20 dBm (10–30 MHz), −20 to +20 dBm (30 MHz–7 GHz)
• Frequency transient range: 1.6 to 25.6 MHz (heterodyne mode)
VCO Characterization
• Frequency vs. DC control voltage, frequency pushing, RF power vs. control voltage, DC current vs. control voltage
– Key Features
• Multi-band phase noise measurement with configurable offset ranges
• Transient analysis: simultaneous frequency, phase, and power tracking over time
• Pretrigger capability: −80% of time span or +1 second (direct mode)
• Flexible input level accommodation across the measurement range
– Typical Applications
• Crystal oscillator and VCO evaluation
• PLL synthesizer characterization
• LO circuit and RFIC assessment
• DRO and YIG oscillator testing
– Compatibility & Integration
The E5052A integrates with existing test benches for automated source characterization. Multiple frequency and gain configuration options enable customization for specific measurement requirements across 10 MHz to 110 GHz applications.
