The Keysight (Agilent) E5502A Phase Noise Measurement Solution characterizes signal sources and components across 50 kHz to 6.0 GHz with absolute and residual phase noise measurement capability. Built to minimize production ATE test times, the system delivers sensitivity and measurement speed—achieving test times under 3 seconds for 1 kHz to 100 kHz offsets and under 30 seconds for 10 Hz to 1 MHz offsets. The E5502A measures AM noise directly and supports multiple measurement techniques including phase detector, PLL/reference source, heterodyne discriminator, and frequency-discriminator methods.
Technical Specifications
Frequency Range
• Carrier frequency: 50 kHz to 6.0 GHz
• Standard offset range: 0.01 Hz to 4 MHz (A-series models); up to 100 MHz (B-series models)
Measurement Performance
• Phase noise: absolute and residual measurement with excellent integrity and repeatability
• AM noise: direct measurement capability
• Sensitivity:
• Measurement speed: test times less than 3 seconds for 1 kHz to 100 kHz offsets; less than 30 seconds for 10 Hz to 1 MHz offsets
System Architecture
• Low-noise down-converter optimized for stated frequency range; 6 GHz down-converters support minimum input frequency of 1 GHz
• Modular, object-oriented client/server architecture
• SCPI programming interface with Windows-compliant graphical user interface
– Key Features
• Multiple measurement techniques reduce setup complexity and enable flexible test configurations
• Fast measurement speed minimizes production test duration
• Modular architecture allows equipment sharing with other measurement functions
– Typical Applications
Characterization of one-port devices including VCOs, DROs, crystal oscillators, and synthesizers. Also supports two-port devices such as amplifiers and converters. Handles CW, pulsed, and spurious signals.
– Compatibility & Integration
Quick integration into existing ATE systems. SCPI-compatible command set enables programming control. Flexible configurations support multiple measurement types within a single test environment.
