The Keysight 34330A is a precision current shunt that extends the current measurement capabilities of digital multimeters by introducing a known, low-resistance element into the circuit. Current is measured indirectly through the voltage drop across the shunt, which provides a linear output of 1 mV/A. The device is housed in an epoxy-encased plastic enclosure rated for Category II installation.
Technical Specifications
• Shunt Resistance: 0.001 Ω (1 mΩ)
• Continuous Current: 15 A
• Peak Current: 30 A (maximum 15 minutes duration)
• Voltage Output Sensitivity: 1 mV/A
• AC Voltage Limit: 30 Vrms
• DC Voltage Limit: 60 V
• Measurement Accuracy: ±0.3% (DC to 1 kHz); ±5% (1 kHz to 5 kHz at 10 A)
• Operating Temperature: 5 to 40 °C
• Storage Temperature: −30 to 70 °C
• Operating Humidity: 0 to 80% RH
• Maximum Altitude: 2000 meters
• Safety Class: Class 1 (with protective earth terminal)
• Pollution Degree: 2
– Key Features
• Dual banana plugs interface with DMM voltage input terminals
• Binding posts for current source connection
• Low voltage burden minimizes circuit loading in digital applications
• Linear 1 mV per ampere sensitivity simplifies data interpretation
• Ground protection connector included to prevent measurement errors
• Low shunt resistance (1 mΩ) reduces power dissipation and circuit disruption
– Typical Applications
The 34330A is used for precision current measurement in applications where the DMM’s internal current measurement range is insufficient or where external shunt measurement is preferred. Its low resistance and high current capability support testing in power electronics, battery characterization, and precision current monitoring circuits.
– Compatibility & Integration
The shunt integrates with Keysight digital multimeters including the 34401A, 34405A, 34410A, 34411A, L4411A, 3458A, 34460A, and 34461A. Connection is made through the DMM’s standard voltage input terminals, not the high ampere inputs. The shunt’s ground protection connector and dual-banana-plug design ensure proper isolation and measurement integrity.
