The Agilent/Keysight 3458A is an 8.5-digit digital multimeter engineered for metrology, calibration, and precision measurement applications demanding exceptional accuracy and stability. It delivers seven measurement functions with resolution to 8.5 digits, advanced waveform digitizing across three independent methods, and reading rates to 100,000 per second for maximum test throughput.
Technical Specifications
Measurement Functions
• DC Voltage, AC Voltage, Resistance, DC Current, AC Current, Frequency, Period
• Resolution: Up to 8.5 digits
DC Voltage
Transfer accuracy at 10 V DC: 0.1 ppm over 1 hour ±0.5°C. Long-term stability rated at 8 ppm/year; optional high-stability reference (Option 002) achieves 4 ppm/year. Features exceptional DCV linearity accuracy.
AC Voltage
Midband absolute measurement accuracy of 300 ppm (analog true RMS) or 100 ppm absolute accuracy for 45 Hz to 1 kHz (sampling technique). Two-year accuracy maintained with single 10 V DC precision standard.
Resistance
Range: 10 µΩ to 1 GΩ. Midrange accuracy of 2.2 ppm. Offset-compensated ohms eliminate errors from small series voltage offsets in two- and four-wire measurements.
Digitizing Capabilities
Standard DCV function: 0.2 to 100,000 readings/sec with 28-bit to 16-bit resolution. Arbitrary sample apertures from 500 ns to 1 second in 100 ns increments. Input bandwidth 30 kHz to 150 kHz depending on range.
Direct Sampling (DSDC, DSAC): 2 ns fixed aperture, 16-bit resolution, 50,000 samples/second maximum. 12 MHz input bandwidth. Internally paced by 0.01% accurate timebase with 100 ns time steps.
Sequential/Sub-sampling (SSDC, SSAC): 2 ns aperture, 16-bit resolution. Effective digitizing rates to 100 Msamples/second with 10 ns time increments.
– Key Features
• Reading rates to 100,000 per second
• Internal test setup changes exceed 340 per second
• Auto-calibration (ACAL) corrects for component drift; full calibration approximately 12 minutes
• Keysight Multimeter Language (ML) compatible
– Typical Applications
R&D laboratories, production test environments, and calibration facilities requiring high-resolution DC and AC measurements with low drift and rapid acquisition rates.
