The Agilent/Keysight 85103D is a performance upgrade package that transforms the 8510B network analyzer into an 8510C-equivalent instrument. This upgrade delivers faster measurements, enhanced display capabilities, and advanced analytical functions for precise S-parameter characterization of RF and microwave components. The 85103D enables three times faster measurement speeds and unlocks firmware-based features including power sweep, receiver calibration, and time-domain analysis with improvements of two to sixteen times over baseline performance.
Technical Specifications
• Frequency range: 45 MHz to 110 GHz (depending on test set and synthesizer configuration)
• Receiver dynamic range: 86 dB to over 106 dB (band and configuration dependent)
• Time domain measurement speed: 2× to 16× faster than baseline
• Error-correction speed: 25% improvement
• Display: 16-color high-resolution screen
• Storage: 3.5-inch disk drive
• On-screen markers: Five readout positions
– Key Features
• Measurement speed increase of 3× compared to 8510B baseline
• Simultaneous four S-parameter display for streamlined analysis
• Power sweep functionality for device characterization under variable power levels
• Receiver calibration for improved nonlinear measurement accuracy
• Limit lines for automated pass/fail testing criteria
• Dissimilar connector compensation
• Full-color printer compatibility
• Measurement buffering for plots and printouts
• Internal real-time clock for timestamped data logging
• Enhanced printed data listings
– Typical Applications
• RF and microwave component characterization
• S-parameter measurements for device behavior analysis
• Nonlinear device testing with receiver calibration
• Time-domain reflectometry and impulse response measurement
• Automated production testing with limit line functionality
– Compatibility & Integration
The 85103D upgrade integrates with Agilent/Keysight 8510 series network analyzers, specifically upgrading the 8510B to 8510C performance specifications. Frequency coverage extends based on the paired test set and synthesizer configuration.
