The Agilent/Keysight 8590E is a benchtop spectrum analyzer for RF and microwave signal measurement from 9 kHz to 1.8 GHz. It delivers calibrated amplitude measurements from +30 dBm to -130 dBm across a 70 dB onscreen display range, with sensitivity down to -70 dBm at 30 Hz resolution bandwidth. The instrument handles peak pulse power to +50 dBm (100 W) under controlled conditions and maintains excellent dynamic range through -77 dB second-order distortion and -90 dB third-order intermodulation performance.
Technical Specifications
Frequency and Phase
• Frequency range: 9 kHz to 1.8 GHz (50 Ohm); 1 MHz to 1.8 GHz (75 Ohm optional)
• Resolution bandwidth: 1 kHz to 3 MHz standard; optional 30 Hz to 300 Hz narrowband filters
• EMI bandwidths: 9 kHz and 120 kHz available
• Phase noise: -105 dBc at 30 kHz offset
• Frequency reference aging: ±2 × 10⁻⁶/year; temperature stability ±5 × 10⁻⁶
Amplitude and Dynamic Range
• Calibrated range: +30 dBm to -130 dBm
• Display range: 70 dB onscreen
• Maximum input (≥10 dB attenuation): +30 dBm average continuous; +50 dBm peak pulse
• Gain compression: ≤0.5 dB at –10 dBm mixer input
• Second-order distortion: 77 dB; third-order intermodulation: 90 dB
Sweep and Video
• Sweep time: 20 ms to 100 s (zero span); optional 20 µs minimum
• Video bandwidth: 30 Hz to 1 MHz standard; optional 1 Hz to 1 MHz
• Sweep modes: free run, single, line, video, external trigger
– Key Features
• Optional precision frequency reference improves accuracy to 210 Hz
• Expandable through optional measurement personality cards and circuit modules
• GPIB and RS-232C programmable control; parallel printer port for direct output
• Memory card support (32 K to 512 K) for measurement personalities and data storage
• External keyboard interface for analyzer control
– Typical Applications
• RF and microwave signal characterization
• EMI/RFI compliance testing with dedicated 9 kHz and 120 kHz bandwidths
• Digital modulation analysis
• Field and laboratory measurements
– Compatibility & Integration
GPIB and RS-232C interfaces enable integration into automated test systems. HP-IB and RS-232 printer/plotter output options provide direct documentation of measurements.
