The Agilent/Keysight 86146B is a benchtop optical spectrum analyzer delivering high-resolution spectral analysis from 600 nm to 1750 nm. Built on a double-pass monochromator design, it achieves superior sensitivity and dynamic range while maintaining fast sweep speeds—critical for DWDM component characterization, broadband passive component testing, and active optical source/amplifier analysis.
The instrument provides selectable resolution bandwidths from 0.04 nm to 10 nm via internal and external optical paths, enabling precise spectral separation of closely-spaced channels and broadband features. Wavelength accuracy reaches ±10 pm at the 1480–1570 nm band following internal calibration with enhanced wavelength correction, and reproducibility is ±0.003 nm. Amplitude accuracy of ±0.35 dB at –20 dBm (1550 nm, 20–30 °C) supports reliable power measurements across the operating range.
Dynamic range performance at 0.1 nm RBW includes –60 dB at ±100 GHz offset from 1550 nm and –40 dB at ±25 GHz offset, enabling detection of weak spectral components near strong signals. Tuning repeatability of ±0.002 nm ensures consistent measurement results across multiple acquisitions.
Multiple resolution bandwidth options, trace averaging, and comprehensive marker functions simplify detailed spectral analysis in laboratory and field environments. The instrument supports both internal self-calibration and external reference source calibration to meet stringent accuracy requirements in WDM network deployment and dense optical component development.
Technical Specifications
• Wavelength Range: 600 nm to 1750 nm
• Resolution Bandwidth (internal path): 0.06 nm, 0.07 nm, 0.1 nm, 0.14 nm, 0.2 nm, 0.33 nm, 0.5 nm, 1 nm, 2 nm, 5 nm, 10 nm
• Resolution Bandwidth (external path): 0.04 nm, 0.05 nm, 0.07 nm, 0.1 nm, 0.2 nm, 0.3 nm, 0.5 nm, 1 nm, 2 nm, 5 nm, 10 nm
• Wavelength Accuracy (after internal calibration, 1480–1570 nm): ±0.01 nm
• Wavelength Accuracy (after internal calibration, 1570–1620 nm): ±0.025 nm
• Wavelength Reproducibility (≤1 min): ±0.003 nm
• Tuning Repeatability: ±0.002 nm
• Absolute Wavelength Accuracy (factory calibration, 2 yr cycle): ±0.5 nm
• Amplitude Accuracy (–20 dBm @ 1550 nm, 20–30 °C): ±0.35 dB
• Amplitude Accuracy (general): ±0.5 dB
• Close-In Dynamic Range @ 0.1 nm RBW (±100 GHz @ 1550 nm): –60 dB
• Close-In Dynamic Range @ 0.1 nm RBW (±25 GHz @ 1550 nm): –40 dB
• Amplitude Stability: 10 mdB
– Key Features
• Double-pass monochromator design for high sensitivity and dynamic range
• Fast sweep speeds with trace averaging
• Multiple marker functions for precise peak and spectral feature location
• Internal and external optical path configurations
• Noise marker bandwidth accuracy (1525–1610 nm): ±2% for ≥0.5 nm RBW; ±3% for 0.2 nm RBW; ±7% for 0.1 nm RBW; ±12% for 0.06 nm RBW
– Typical Applications
• WDM system testing and validation
• DWDM component characterization
• Passive optical component analysis
• Active optical source and amplifier evaluation
• Dense optical network development
– Compatibility & Integration
Supports internal self-calibration and external reference source calibration for enhanced accuracy across the full wavelength range.
