The Agilent/Keysight 8712B is an RF network analyzer that integrates a synthesized source, test set, and dual-channel display for vector measurement of RF components and networks across 300 kHz to 1.3 GHz. Purpose-built for high-volume manufacturing environments, it delivers phase, complex impedance, and linear group delay measurements with two independent display channels capable of simultaneous dual-parameter visualization.
Technical Specifications
Frequency Coverage and Source Performance
• Frequency range: 300 kHz to 1.3 GHz
• Frequency resolution: 1 Hz
• Frequency stability: ±5 ppm (0°C to 55°C, typical)
• Frequency accuracy: ±5 ppm at 25°C ±5°C; <1 Hz at 10% line voltage change
• Phase noise: –70 dBc/Hz at 10 kHz offset
• Residual AM: <–50 dBc (100 kHz bandwidth)
• Residual FM: <1.5 kHz peak (30 Hz to 15 kHz)
• Harmonic suppression: <–20 dBc (<1 MHz), 1 MHz)
• Nonharmonic spurious: <–20 dBc (<1 MHz), <–30 dBc (≥1 MHz)
Power Output
• Output power resolution: 0.01 dB
• Output power level accuracy: ±1.0 dB (standard); ±1.5 dB (Option 1EC1); ±2.0 dB (Option 1E1); ±3.0 dB (Options 1EC1 and 1E1)
Receiver and Display
• Dual independent display channels
• Display resolution: 0.01 dB/division (amplitude), 0.1°/division (phase)
• Noise floor: Specified at 15 Hz IF bandwidth, 10 dB source power, response and isolation calibration applied
Measurement Formats and Capabilities
• Rectilinear: Log or linear magnitude, phase, group delay, SWR, real and imaginary, dBv, dBmv, dBuv (75 Ω only)
• Smith chart and polar formats
• Narrowband measurements: Reflection (A/R), Transmission (B/R), A, B, R
• Broadband measurements: X, Y, Y/X, X/Y, Y/R, Power (B, R), Conversion Loss (B/R)
• S-parameter measurement with two-port vector-error correction (ES models)
• Group delay measurement through frequency-translation devices (Option 1DA/1DB)
– Typical Applications
RF component characterization, impedance analysis, transmission and reflection measurements, manufacturing test and validation, device tuner and mixer evaluation.
– Compatibility & Integration
Synthesized source, test set, and integrated display in single platform. Vector measurement capability supports error-corrected S-parameter analysis on specified models.
