The Agilent/Keysight DSOX3012T is a 100 MHz, 2-channel digital storage oscilloscope designed for signal analysis and troubleshooting in electronic design and test environments. The instrument combines a capacitive 8.5-inch touchscreen interface with a 1,000,000 waveforms/second update rate to capture transient events reliably. With 4 GSa/s sampling, 100,000 points memory depth per channel, and 8-bit vertical resolution, it delivers the acquisition speed and detail needed for detailed waveform characterization.
Technical Specifications
Acquisition
• Bandwidth: 100 MHz
• Channels: 2
• Sample Rate: Up to 4 GSa/s
• Memory Depth: 100,000 points per channel
• Vertical Resolution: 8 bits
• Vertical Sensitivity: 1 mV/div to 10 V/div
• Waveform Update Rate: Up to 1,000,000 waveforms/second
Display
• 8.5-inch capacitive touchscreen
– Key Features
Triggering Modes
Edge, pulsed width, pattern, line-selectable, video, runt, setup/hold, and logic triggering enable capture of specific signal conditions across diverse measurement scenarios.
Automated Measurements
The instrument provides amplitude parameters (peak-to-peak, amplitude, max, min, mean, RMS), time-domain measurements (period, frequency, rise/fall time, duty cycle), channel-to-channel delay, and area calculations. Histogram and eye diagram functions support statistical analysis. Search and mark capability automatically identifies and flags events within waveforms.
Analysis Functions
Basic math operations—add, subtract, multiply, divide—and FFT analysis enable frequency-domain investigation. User-defined functions allow custom computations on captured data.
Protocol Decode
Serial protocol analysis supports I2C, SPI, UART, CAN, and LIN. Protocol decode capabilities are licensed options.
– Connectivity & Integration
• USB Host: Waveform and setup file management
• USB Device: Remote instrument control and PC connectivity
• LAN (Ethernet): Network-based remote operation
• Probe Compensation Output
– Typical Applications
Signal integrity verification, frequency response analysis, timing and phase measurements, digital protocol debugging, and embedded system troubleshooting.
