The Agilent/Keysight E1476-80010 is a QUIC-type terminal block accessory that provides screwless spring clamp connectivity to the E1476A High-Density Reed Relay Multiplexer module. This accessory enables direct access to high, low, and guard connections across all 64 channels of the E1476A, facilitating high-point count measurements and multi-wire switching configurations within VXIbus systems.
Technical Specifications
Terminal Interface
• QUIC spring clamp terminal block
• Wire size compatibility: 22 to 26 AWG (0.5, 0.75, 0.9 mm)
• Dual bank channel configuration supporting flexible measurement topologies
E1476A Module Compatibility
• C-size, 1-slot, register-based VXI module
• 64 total switching channels
• Two-wire switching: up to 64 channels
• Three-wire switching: up to 32 channels
• Four-wire switching: up to 32 channels
Supported Measurement Types
• High-integrity voltage measurements (three-wire configuration)
• Two-wire resistance measurements
• Precision four-wire resistance measurements
• Thermocouple temperature measurements with automatic cold junction compensation
– Key Features
• Screwless QUIC terminals eliminate the need for conventional screw fasteners, reducing assembly time and connection inconsistencies
• Low-offset, thermocouple-compensated design for precision temperature measurement applications
• Dynamically configurable channel allocation allows channels to function as sense or current source channels
• Dedicated guard connections enable three-wire high-integrity voltage measurements for sensitive analog circuits
• Supports 32 four-wire measurement channels through dual bank configuration
– Compatibility & Integration
The E1476-80010 terminal block directly interfaces with the E1476A multiplexer card via direct insertion onto the component card. Integration within VXIbus systems allows remote control and automated channel switching via register-based commands, making the accessory suitable for multi-channel data acquisition and laboratory switching applications requiring precision switching and measurement integrity.
