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Agilent/Keysight E4727B

SKU: E4727BCategories: Laboratory Measurement Instruments
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The Agilent/Keysight E4727B is a versatile network analyzer designed for testing and characterizing RF and microwave components and systems. It delivers accurate measurements and comprehensive analysis capabilities, making it suitable for various applications in research, development, and manufacturing.

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$655.00

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Equipment info

The Keysight E4727B Advanced Low-Frequency Noise Analyzer (A-LFNA) characterizes semiconductor device noise performance from 30 mHz to 100 MHz. This instrument measures DC characteristics, 1/f noise (flicker noise), and random telegraph noise (RTN) across FETs, BJTs, diodes, and resistors with noise sensitivity of -185 dBV²/Hz. The E4727B operates at voltages up to 200 V and currents up to 100 mA, with 23 selectable impedance values from 0 ohms to 100 MΩ. Integration with PathWave WaferPro Express enables automated measurement routines and wafer mapping without manual programming. Auto-prober control and compatibility with Keysight device modeling tools—PathWave Model Builder and PathWave IC-CAP—support rapid process design kit development, IC noise specification, and manufacturing statistical process control.

Technical Specifications

• Frequency range: 30 mHz to 100 MHz
• Voltage: up to 200 V
• Current: up to 100 mA
• Noise sensitivity: -185 dBV²/Hz
• Impedance: 23 values, 0 ohms to 100 MΩ
• RTN sampling interval: 1/(500 MHz/2^n), n = 0–32
• RTN sampling number: 2^n, n = 10–24
• Operating temperature: 10 to 40 °C
• Storage temperature: -30 to 70 °C
• Dimensions: 298 × 192 × 104.3 mm
• Weight: 8.9 kg
• Power: 100–240 V, 50/60 Hz

– Key Features

• Measures DC characteristics, 1/f noise, and random telegraph noise on discrete devices
• Supports capacitance and RF S-parameter measurements
• Hardware averaging for throughput-accuracy optimization
• Built-in automated measurement routines for DC, 1/f noise, RTN, and data analysis

– Typical Applications

• Process design kit development
• Integrated circuit noise specification
• Manufacturing SPC and reliability assessment
• Device characterization across FETs, BJTs, diodes, and resistors

– Compatibility & Integration

• Pairs with PXIe computer, digitizer, and DC source measurement unit (B1500A)
• Upgradeable from existing Keysight B1500A systems
• Integrates with PathWave WaferPro Express, PathWave Model Builder, and PathWave IC-CAP
• Automated control of major wafer probing systems
• Supplied with MDR 40-pin cable (2 m), SMA(m)–SMA(m) coaxial cables (1 m and 0.2 m)

MPN

E4727B

Brand Name

Agilent / Keysight

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