The Keysight E5262A is a two-channel Source/Monitor Unit (SMU) delivering high-performance current-voltage characterization for semiconductor devices and materials. This precision IV analyzer combines dual medium-power SMUs with measurement resolution down to 5 pA, enabling low-current analysis from component level through wafer-scale testing. The instrument integrates with EasyEXPERT group+ characterization software, providing both interactive GUI operation and automated test execution on a user’s PC.
Technical Specifications
• Voltage sourcing: 0 V to ±100 V
• Current sourcing: ±100 pA to ±1 A per channel
• Current measurement resolution: 5 pA
• Voltage measurement resolution: 100 µV
• Current compliance: ±100 pA to ±200 mA
• Voltage compliance: 0 V to ±100 V
• Active Ground Unit (GNDU) sink current: up to 2.2 A
• Maximum common-to-ground voltage: ±42 V
• Minimum pulse width: 500 µs (pulsed measurements)
• ADC sampling: 128 samples in 1 PLC per SMU
• Remote control interface: GPIB, FLEX command set
– Key Features
• Eight measurement modes: Spot, Pulsed spot, Quasi-pulsed spot, Staircase sweep, Multi-channel sweep, Pulsed sweep, Staircase sweep with pulsed bias, and search algorithms (Linear/Binary)
• High-speed analog-to-digital conversion on each installed SMU
• Graphical GUI with intuitive keyboard and mouse operation
• Application Test mode for rapid measurement execution
• Built-in workspace database for storing test conditions and measurement data
• Data export to Excel and image formats
• 40-minute warm-up recommended for specified accuracy performance
– Typical Applications
• Semiconductor device characterization and parameter extraction
• Material property analysis
• Component-level IV testing
• Wafer-level device screening and analysis
• Low-current device measurement and analysis
– Compatibility & Integration
The E5262A operates within the Keysight Precision IV Analyzer series ecosystem. EasyEXPERT group+ software runs on user PCs, enabling test setup, execution, graphical analysis, and data management. GPIB connectivity and FLEX command programming support integration into automated test environments and data acquisition systems.
