The Advantest R6581T is an 8.5-digit digital multimeter engineered for high-precision DC measurements in laboratory, development, and quality control environments. This DC-only instrument delivers exceptional accuracy across DC voltage, DC current, and resistance measurements—both 2-wire and 4-wire configurations. The R6581T combines stability with resolution to support demanding metrology and component characterization workflows where measurement uncertainty must be tightly controlled.
Technical Specifications
Display & Resolution
• 8.5-digit display
• Auto-ranging capability
Measurement Functions
• DC Voltage (DCV): 100 mV to 1000 V ranges
• DC Current (DCI): 100 nA to 1 A ranges
• 2-wire Resistance
• 4-wire Resistance: 10 Ω to 100 MΩ ranges
DC Voltage Accuracy (1 Year)
• 100 mV: 7 ppm (reading) + 10 ppm (range)
• 1 V: 6 ppm (reading) + 1 ppm (range)
• 10 V: 5 ppm (reading) + 0.2 ppm (range)
• 100 V: 7 ppm (reading) + 1 ppm (range)
• 1000 V: 7 ppm (reading) + 0.2 ppm (range)
4-Wire Resistance Accuracy (1 Year)
• 10 Ω to 100 kΩ: 8–14 ppm (reading) + 0.5–20 ppm (range)
• 1 MΩ: 50 ppm (reading) + 5 ppm (range)
• 10 MΩ: 500 ppm (reading) + 50 ppm (range)
• 100 MΩ: 5000 ppm (reading) + 50 ppm (range)
DC Current Accuracy (1 Year)
• 100 nA to 10 mA: 20–25 ppm (reading) + 20–400 ppm (range)
• 100 mA: 30 ppm (reading) + 20 ppm (range)
• 1 A: 110 ppm (reading) + 20 ppm (range)
Environmental Stability
• Temperature coefficient: 1.2 ppm/°C (DC Voltage), 3 ppm/°C (DC Current)
• Input resistance: >10 GΩ (DC Voltage)
• Maximum input voltage: 300 V
– Key Features
• Internal 2-source calibration
• Data memory: up to 10,000 points
• Input protection via clipping diodes and resistors
– Typical Applications
Component verification, standards calibration, precision current measurement, high-impedance resistance testing, and long-term stability monitoring in research and production environments.
– Compatibility & Integration
The R6581T operates as a standalone DC measurement instrument. Its data logging capability supports external integration for automated test systems requiring measurement archival.
