The Keysight F9660A is a 3D Multi-Probe Anechoic Chamber (MPAC) platform for Over-The-Air (OTA) testing of 5G millimeter-wave devices. It performs Radio Resource Management (RRM) measurements with multiple Angles of Arrival, NR MIMO OTA tests at FR2 frequencies, dynamic beam management characterization, and full RF conformance testing across antenna white-box and protocol black-box configurations.
Technical Specifications
Frequency Range: 0.5 – 54 GHz
Quiet Zone Diameter: 30 cm (45 cm option available for select configurations)
Chamber Reflectivity: < −50 dB (empty chamber)
Isolation: < 6 GHz: 80 dB (± 5 dB)
Probe Configurations: 2, 6, or 8 probe antennas; up to 36 RF heads
Angle of Arrival Support: Up to eight angles supported with optional configurations
DUT Positioner: Dual-axis (azimuth and roll over azimuth) with full spherical coverage
Azimuth Range: ± 180° with 0.00225° resolution
Supported Device Size: Phones and tablets up to 13 inches in length
RF Connectivity: 8 × SMA female connectors (internal); 2 × 2.4 mm female connectors (probe feed assemblies); available feed assemblies include in-band (24–42 GHz) and spurious (6–110 GHz) options
Antenna Configuration: Dual-polarized feed antennas on azimuth and elevation arcs; FR1 and FR2 link antennas available
– Key Features
• Laser-guided crosshair alignment for precise DUT placement
• Software-controlled positioner enabling repeatable measurement geometry
• Modular probe architecture supports scalable RF head counts
• Direct far-field measurement capability
• 3GPP conformance test case coverage across RRM, MIMO OTA, and beam management scenarios
– Typical Applications
• 5G NR device characterization at mmWave bands
• RF design verification and conformance testing
• Protocol and demodulation testing with variable antenna configurations
• Dynamic beam management performance assessment
• White-box antenna measurement and black-box device protocol validation
– Compatibility & Integration
The F9660A integrates with Keysight Network Emulation and Channel Emulation Solutions to enable complex RF environment simulation during device development and stress testing.
