The Keysight N5230C PNA-L is a configurable microwave network analyzer delivering high-performance S-parameter measurements from 300 kHz to 50 GHz. Built with dual sources and up to 137 dB dynamic range, it characterizes passive and active components with speed and precision. The instrument balances cost-effectiveness with enterprise-class firmware, making it ideal for R&D, production test, and general-purpose network analysis across multiple frequency bands and port configurations.
Technical Specifications
Frequency Coverage and Architecture
• Configurable bands: 300 kHz–6 GHz, 300 kHz–13.5 GHz, 300 kHz–20 GHz, 10 MHz–20 GHz, 10 MHz–40 GHz, 10 MHz–50 GHz
• 2-port or 4-port configurations (4-port available for 300 kHz–13.5 GHz and 10 MHz–20 GHz)
• Dual built-in sources
• 32 measurement channels; 32,001 points per sweep
Measurement Performance
• Dynamic range: 122 dB (standard), 137 dB (optional); 110 dB system dynamic range
• Trace noise: 0.006 dB RMS at 10 Hz IF bandwidth, 10–13.5 GHz
• Measurement speed: 7 ms sweep time; 4–9 µs per point; <4 ms/point
• IF bandwidth: 1 Hz to 250 kHz
• Source harmonics: <–60 dBc typical
• Output power: +5 dBm typical; +10 dBm; +13 dBm (gain compression at 20 GHz)
• Power sweep: Up to 25 dB; 38 dB for gain compression at 20 GHz
– Key Features
• Vector-error corrected calibration with TRL/LRM, SOLT, LRRM, TRL+/LRM, and LRM/TRL+/LRRM options
• Time-domain analysis for impedance measurement and device diagnostics
• Fixture de-embedding for accurate device characterization
• Mixer conversion loss/gain, magnitude, and phase measurements
• AM-AM and AM-PM gain compression analysis
• Intermodulation distortion (IMD) measurements via dual sources with internal combiner
• Pulsed-RF device characterization
• Single-ended, balanced, and mixed-mode differential measurements
• Multiport measurement capabilities
• On-wafer calibration software compatibility
– Typical Applications
• Component characterization (active and passive microwave devices)
• Manufacturing S-parameter test and validation
• Amplifier and mixer characterization
• Transmission line and filter analysis
• On-wafer device measurement
– Compatibility & Integration
Shares core firmware with higher-end PNA series instruments, enabling consistent measurement algorithms and operator familiarity across product lines.
