The Anritsu 37397D is a vector network analyzer system engineered for precise S-parameter measurements and RF characterization across 40 MHz to 65/67 GHz. This integrated platform combines synthesized source, S-parameter test set, and tuned receiver into a single compact unit optimized for both R&D and manufacturing deployment. Part of the Lightning 37000D series, the 37397D delivers 115 dBm maximum dynamic range and 0 dBm output power, supporting fast, accurate measurements of passive and active devices in demanding RF environments.
Technical Specifications
• Frequency Range: 40 MHz to 65/67 GHz
• Maximum Dynamic Range: 115 dBm
• Output Power: 0 dBm
• Power Requirements: 85 to 240 VAC, 48 to 63 Hz, 540 VA maximum
• Internal Bias Tees: Standard on premium models
• Source Step Attenuator: Standard on premium models
• Test Port Attenuator: Standard on premium models
– Key Features
• Direct-Access Receiver configuration with front-panel access to all four receiver samplers for antenna, frequency conversion, and multi-output device measurements
• Automatic swept power and swept frequency gain compression measurement routines for amplifier testing
• Gain Compression Application for characterizing amplifier compression behavior
• NxN Calibration Utility for mixer measurements and frequency translation device characterization
• Multiport testing with external test set and application software support for four-port or multiple two-port calibrations
• Embed/De-Embed Application for S2P network manipulation and fixture removal
• Optoelectronic device measurement capability for E/O and O/E characterization (requires optional MN4765A O/E calibration module and laser source)
• Optional High Speed Time Domain analysis for frequency-to-time domain conversion of reflection and transmission measurements
– Typical Applications
The 37397D serves defense, satellite, radar, broadband communication, and optoelectronic component markets requiring detailed signal characterization and network analysis.
– Compatibility & Integration
Part of the Anritsu Lightning 37000D series. S-parameter measurements support both passive and active device characterization.
