The Anritsu 37397E Active Vector Network Analyzer characterizes high-frequency devices and components across 40 MHz to 65 GHz. Purpose-built for active and passive device testing, it delivers S-parameter measurements, gain compression analysis, mixer characterization, and optoelectronic device evaluation. Four independent measurement channels support multiport testing on balanced and differential devices. The instrument serves research, development, and manufacturing environments in defense, satellite, broadband communication, and optoelectronics sectors.
Technical Specifications
Frequency Range: 40 MHz to 65 GHz
Measurement Capabilities
• S-Parameters: S11, S21, S22, S12, and user-defined combinations of a1, a2, b1, and b2
• Active and passive device testing
• Swept power gain compression and swept frequency gain compression with user-intuitive AM/PM measurement application
• Direct measurement of frequency translation devices via NxN multiple device solution utility
• Multiple source control for independent two-source and receiver operation
• Balanced and differential multiport testing (optional multiport test set)
• E/O and O/E device measurements with de-embedding routines and photo-detector transfer functions
• Embedding/de-embedding of S2P networks for fixture and device removal
• Time domain measurement with optional high-speed capabilities (Option 002A)
• CW mode for single frequency measurements without recalibration
• Fast CW operation for rapid GPIB data acquisition
Calibration Methods
• SOLT, offset short, waveguide, and Multiple Line calibration kits for metrology-grade LRL/LRM calibrations
• Adapter removal calibration for non-insertable device measurement
• AutoCal for coaxial calibration
• User-defined calibration standards: open capacitance, load and short inductances, load impedance, and reflection standard offsets
• Frequency range narrowing within calibration range without recalibration
– Key Features
• Four independent measurement channels
• Impedance discontinuity analysis via time or distance measurement
• Metrology-grade Multiple Line calibration capability
