The Anritsu ME7838 VectorStar Broadband Vector Network Analyzer is a high-performance VNA system engineered for precise characterization of microwave and millimeter-wave devices from near-DC to sub-terahertz frequencies. Its modular architecture supports scalable configurations with extended frequency coverage, exceptional measurement stability, and dynamic range performance across the broadest single-sweep bandwidth available. Purpose-built for demanding research, development, and manufacturing metrology.
## Technical Specifications
**Frequency Coverage**
• ME7838A4/A4X: 70 kHz to 110 GHz (options to 125 GHz)
• ME7838E4/E4X: 70 kHz to 110 GHz
• ME7838D4: 70 kHz to 145 GHz (operational from 40 kHz)
• ME7838G4: 70 kHz to 220 GHz (operational from 40 kHz to 226 GHz)
• mmWave module extension capability to 1.1 THz
**Dynamic Range**
• 109 dB at 110 GHz; 102 dB at 220 GHz
• ME7838D: 120 dB at 10 MHz, 108 dB at 65 GHz, 108 dB at 110 GHz, 94 dB at 145 GHz
• ME7838G: 120 dB at 10 MHz, 112 dB at 67 GHz, 108 dB at 110 GHz, 100 dB at 145 GHz
• VectorStar series exceeds 140 dB across broadband configurations
**Calibration and Measurement Stability**
• Calibration stability: 0.1 dB over 24 hours
• Phase measurement stability: typically better than 0.05° over 24 hours at 25°C (ME7838AX/EX)
• Positive raw directivity across all frequency bands—unique among broadband VNA systems
**Measurement Performance**
• Measurement speed: 1 second at 1601 points, 10 kHz IFBW (ME7838AX/EX); 310 ms for 401 points at 10 kHz IFBW (ME7838G)
• Noise figure measurement: 70 kHz to 125 GHz; optimized noise receiver option 30 GHz to 125 GHz
• Differential Noise Figure option available for differential device characterization
• Power output: up to +15 dBm at 70 GHz; dual independent sources with high output power
## Key Features
• Widest single-sweep frequency coverage for broadband applications
• Compact mmWave modules: ~0.6 lb, 1/50th the volume of conventional modules
• Direct probe-station integration for on-wafer measurement capability
• Excellent noise floor performance enabling high-sensitivity characterization across entire sweep range
## Typical Applications
Device and subsystem characterization spanning microwave through millimeter-wave frequencies; noise-figure analysis; on-wafer device testing; component validation across extended frequency ranges.
## Compatibility & Integration
Modular design supports customer configuration and future upgrades. mmWave modules integrate directly with smaller probe stations and on-wafer probe configurations.
