The Anritsu MS4647A is a high-performance Vector Network Analyzer covering 10 MHz to 70 GHz, engineered for RF, microwave, and millimeter-wave device characterization across aerospace, defense, communications, and semiconductor applications. This VectorStar family instrument delivers fast measurement speeds, superior dynamic range, and advanced data resolution from a single coaxial test port.
Technical Specifications
• Frequency Range: 10 MHz to 70 GHz (standalone); extended coverage to 70 kHz available with broadband configurations
• Dynamic Range: Up to 140 dB; 100 dB at 70 GHz
• Sweep Speed: Less than 20 µs/point (fastest synthesized); typical 20 µs/point in true swept mode with 25,000 points
• Data Resolution: Up to 100,001 points in single channel mode for maximum measurement flexibility
• Output Power: Up to +13 dBm
• Test Port Performance:
– Directivity: Up to 50 dB
– Source Match: Up to 50 dB
– Load Match: Up to 50 dB
• Noise Floor: –85 dBm at 70 GHz with 10 kHz IFBW (Option 051)
• IF Bandwidth: Selectable settings including 10 kHz, 30 kHz, 100 kHz, 400 kHz, and 1 MHz
• Warm-Up Time: 90 minutes
• Operating Temperature: 25 °C ± 5 °C; error-corrected specifications warranted over 23 °C ± 3 °C
– Key Features
• Two-port S-parameter measurements (S11, S21, S22, S12) and user-defined a/b wave combinations
• Four-port capability via VectorStar MN4690B Series Multiport VNA Measurement System
• Precision AutoCal automatic calibration with superior accuracy compared to traditional SOLT methods
• Spectrum Analyzer option extending coverage from 70 kHz to 220 GHz, with banded configurations to 1.1 THz
• Dual SPA mode for mixer, amplifier, harmonic, and spurious measurements
• Open Windows architecture for versatile connectivity
– Typical Applications
Device modeling, component characterization, amplifier and filter testing, antenna measurement, and advanced R&D in high-frequency systems.
– Compatibility & Integration
Supports Universal Fixture Extraction (UFX) software for fixture de-embedding and advanced measurement analysis.
