The Anritsu MW9076K is a field-portable Optical Time Domain Reflectometer engineered for high-resolution fiber fault detection and characterization in telecommunications and enterprise network installations. Operating across 850 nm and 1300 nm wavelengths on graded-index multimode fiber, the instrument delivers 5 cm spatial resolution with a 7 m dead zone and dynamic range up to 25 dB. Full-automatic measurement completes in 10 seconds, with real-time sweep capability at 0.15 s and comprehensive measurement modes supporting total loss, interval loss, cable length, splice loss, and return loss quantification across up to 99 detected events. The MW9076K incorporates dual-wavelength OTDR functionality for chromatic dispersion measurement with ±0.05 ps/(nm·km) reproducibility and 30 dB dynamic range over 25 km fiber spans.
Technical Specifications
• Wavelengths: 850 nm (GI), 1300 nm (GI)
• Dynamic Range: 21–25 dB (multimode)
• Dead Zone: 7 m (multimode)
• Spatial Resolution: 5 cm
• Sampling Points: 50,000
• Measurement Speed: 10 s (full-auto mode); 0.15 s real-time sweep; ≤60 s automatic measurement
• Chromatic Dispersion Reproducibility: ±0.05 ps/(nm·km)
• CD Dynamic Range: 30 dB
• Display: 8.4 inch TFT-LCD color (indoor/outdoor variants)
• Internal Memory: ~18 MB for waveform archival
– Key Features
• Automatic Fault Location with Full-Auto and Auto modes
• Automatic front-panel connector quality verification
• Optical signal presence detection
• Connection loss, return loss, and total return loss measurement
• Loss per unit length calculation between arbitrary points
• Warning level threshold configuration
• Event detection up to 99 instances
• Dual-wavelength chromatic dispersion characterization
– Typical Applications
• Installation acceptance testing and commissioning of multimode fiber links
• Maintenance troubleshooting and fault localization
• Splice and connector loss verification
• Fiber plant integrity assessment
– Compatibility & Integration
• Multimode graded-index (GI) optical fiber at 0.85 µm and 1.3 µm
• Measurement data exportable via onboard memory for offline analysis and reporting
