The Burleigh/Exfo WA-7100 is a high-precision interferometric wavemeter for wavelength measurement across the 1270 nm to 1680 nm spectral band. Built for telecommunications, fiber optics R&D, and photonics manufacturing, it delivers ±0.01 nm resolution and ±0.1 nm accuracy to support laser source characterization, transceiver validation, and optical component qualification. The instrument accepts -30 dBm to +10 dBm optical signals via singlemode fiber (9/125 µm), FC/PC or SC/APC connectors, and measures wavelengths at up to 10 Hz refresh rate. Data streams via USB 2.0 or Gigabit Ethernet to external control systems running EXFO software suites or custom SCPI automation. An integrated LCD display provides real-time readout. Operating from 100–240 VAC, 50/60 Hz, the WA-7100 measures 178 mm (H) × 432 mm (W) × 457 mm (D) and weighs approximately 15 kg. Standard 19-inch rack mount kits accommodate integration into telecom labs and production test stands. Temperature stability spans 15°C to 30°C operational and −20°C to +70°C storage; humidity tolerance is 5% to 95% non-condensing. External triggering and synchronization via BNC connectors enable tight timing coordination with related optical test equipment.
## Technical Specifications
• Wavelength measurement range: 1270 nm to 1680 nm
• Accuracy: ±0.1 nm (typical)
• Resolution: Better than 0.01 nm
• Measurement speed: Up to 10 Hz
• Input optical power range: −30 dBm to +10 dBm
• Fiber input: Singlemode (9/125 µm)
• Measurement principle: Interferometric
• Display: Integrated LCD screen
• Power supply: 100–240 VAC, 50/60 Hz
• Operating temperature: 15°C to 30°C
• Storage temperature: −20°C to +70°C
• Humidity: 5% to 95% non-condensing
• Dimensions: 178 mm (H) × 432 mm (W) × 457 mm (D)
• Weight: Approximately 15 kg (33 lbs)
## Key Features
• Dual optical connectors: FC/PC and SC/APC selectable
• USB 2.0 and Gigabit Ethernet data output
• External trigger input and synchronization output (BNC)
• 19-inch rack mount capability
• SCPI command support for automated test integration
## Typical Applications
• WDM component and tunable laser characterization
• Wavelength verification in passive and active fiber optic device manufacturing
• Laser diode and broadband source measurement
• Quality control validation of optical components
## Compatibility & Integration
• EXFO optical test software suites
• Custom automation via SCPI over Ethernet or USB
• Windows 7/8/10 operating systems
