The EXFO / Burleigh WA-1150 is a high-precision optical wavelength meter built around a scanning Michelson interferometer for absolute wavelength determination across the 700–1650 nm band. It simultaneously measures total optical power and maintains continuous calibration via an internal wavelength reference, delivering NIST-traceable results with 3σ confidence. The instrument characterizes DWDM components including DFB and tunable transmission lasers, calibrates passive optical components and test equipment, and supports demanding research and laser characterization workflows across CW, modulated, and SONET/SDH signal types.
Technical Specifications
• Wavelength range: 700–1650 nm (181–428 THz)
• Wavelength accuracy: ± 1.5 pm absolute
• Wavelength resolution: 0.001 nm
• Optical power accuracy: ± 0.5 dB
• Optical power resolution: 0.01 dB
• Optical power linearity: ± 0.3 dB
• Maximum input level: +10 dBm
• Optical input: 9/125 µm single-mode fiber
• Calibration: Continuous, built-in wavelength reference
• Measurement confidence: 3σ (≥ 99.6%)
• Traceability: NIST recognized standards
– Key Features
• Dual-function measurement: simultaneous wavelength and optical power acquisition
• Scanning Michelson interferometer architecture ensures repeatable, traceable results
• Support for CW, modulated, and SONET/SDH optical signals
• Remote control via RS-232 and GPIB interfaces
• Benchtop or rack-mount form factor with front-panel controls
– Optical Connectors & Integration
• Standard connector: FC/UPC
• Optional connectors: FC/APC, SC/UPC, SC/APC, ST/UPC
• Remote interfaces: RS-232, GPIB
– Typical Applications
• DWDM component characterization and validation
• Calibration of passive DWDM components and test stations
• Laser wavelength verification for optical communications systems
• Research requiring sub-picometer absolute accuracy
