The Exfo IQ-5310-89 is a modular wavelength meter module engineered for integration into EXFO’s IQ-200 Optical Test System. It measures the central wavelength and frequency of single incoming laser signals using a Michelson interferometer architecture, delivering high-fidelity optical characterization across the 600 nm to 1700 nm range.
Technical Specifications
• Wavelength Measurement Range: 600 nm to 1700 nm
• Absolute Wavelength Accuracy: ±0.01 nm
• Wavelength Display Resolution: 0.001 nm
• Power Measurement: Simultaneous display of central wavelength and total power
• Laser Linewidth Requirement: Optimal accuracy and resolution with narrow linewidths (<10 GHz)
• Environmental Compensation: Temperature and pressure monitoring for wavelength reporting in vacuum and various air conditions
– Key Features
• Auto Mode: Automatically evaluates laser linewidth and adjusts displayed digit resolution
• Full Mode: Constant 0.001 nm resolution output
• Calibration Options: Factory calibration traceable to NIST; user-calibratable with stabilized HeNe laser or DFB laser diode; EXFO calibration services available
• Modular Form Factor: Plug-in module compatible with IQ series platforms
– Typical Applications
• Measuring central wavelength and frequency of single laser signals
• Determining central wavelength shifts due to environmental variation
– Compatibility & Integration
• Platform: IQ-200 Optical Test System with IQ-203 Control Unit and IQ-206 Expansion Units
• Automated Systems: Integration via Visual Basic and Delphi development environments
• Communications: GPIB and network connectivity; OLE/OCX controls and LabVIEW drivers supported
