The Burleigh WA-1100 is a precision optical wavelength meter engineered for absolute wavelength measurement of CW and modulated laser sources across the near-infrared and visible spectrum. Operating on a scanning Michelson interferometer principle, it compares input laser interference patterns against an internal HeNe reference standard to deliver traceable, calibrated wavelength data. The instrument simultaneously provides optical power measurement, making it suitable for DWDM component characterization, test equipment calibration, and production quality assurance.
Technical Specifications
Wavelength Measurement
• Range: 700 nm to 1700 nm (181 THz to 428 THz)
• Absolute accuracy: ± 1.5 pm
• Display resolution: 0.001 nm
• Measurement cycle time: 0.1 seconds (10 measurements/second)
• Reference laser: Multi-mode HeNe with ± 500 MHz absolute wavelength accuracy
Optical Power Measurement
• Absolute accuracy: ± 0.5 dB (at ± 30 nm from 1310 nm and 1550 nm)
• Power resolution: 0.01 dB
• Power linearity: ± 0.3 dB
• Display resolution: 0.01 dB
Optical Input
• Connector type: 9/125 µm single-mode fiber
• Signal sensitivity: −30 dBm (0.1 µW) for 1200–1600 nm; −20 dBm (1.0 µW) for 700–1650 nm
• Maximum input power: +10 dBm (10 mW); accommodates 100 mW with external attenuator
– Key Features
• Monolithic rigid interferometer in compact, rugged housing
• Continuous calibration with built-in wavelength reference
• Automatic environmental compensation via integrated temperature and pressure sensors
• Microprocessor correction for refractive index of air
– Typical Applications
• DWDM component characterization
• Optical spectrum analyzer (OSA) calibration
• Test equipment and test station calibration
• Tunable and swept-wavelength laser calibration
– Compatibility & Integration
Supported Sources: CW lasers, DFB lasers, tunable lasers, VCSELs
Remote Control: GPIB (IEEE-488.2), RS-232, LabVIEW compatible, LabWindows compatible
