The dBm Optics 2004 Component Spectrum Analyzer (CSA) characterizes optical components with simultaneous measurement of insertion loss (IL), optical return loss (ORL), and polarization dependent loss (PDL). Simultaneous IL and ORL measurements complete in under 1 second across a 100 nm band. Adding PDL extends the measurement time to under 8.5 seconds. The instrument delivers greater than 65 dB dynamic range at full speed, with optional stitched measurements extending beyond 85 dB. Built-in wavelength metering provides sub-picometer accuracy and 1 pm resolution across 100 nm spans.
## Technical Specifications
• **IL and ORL Measurement:** Simultaneous acquisition in <1 second over 100 nm band
• **IL, ORL, and PDL Measurement:** Simultaneous acquisition in 65 dB at full speed; >100 dB total; expandable beyond 85 dB with stitching
• **Wavelength Accuracy:** 55 dB (1500 nm to 1620 nm)
• **Power Measurement Floor:** ~200 fW (-95 dBm) using electrometer charge-counting approach
• **Reading Rate:** 100,000 readings per second per channel
• **Measurement Repeatability:** <0.005 dB
• **PDL Uncertainty (Model –202):** ±0.0015 dB typical; ±0.0035 dB guaranteed
• **PDL Uncertainty (Model –201):** 67 dB at full speed
• Fast mode (10 nW to 2 fW / -50 dBm to -107 dBm): 10 μs measurement, 20 ms response, 5 sec settling
• Medium mode (10 mW to 200 fW / 10 dBm to -97 dBm): 10 ms measurement, 30 ms response, 5.01 sec settling
• Slow mode (10 mW to 0.5 fW / 10 dBm to -117 dBm): 5 sec measurement, 5.02 sec response, 10.02 sec settling
• Optional -410 Precision Wavelength Reference Module with gas-cell calibration and patent-pending mode-hop detection for tunable lasers
## Typical Applications
• Optical component characterization in R&D and production environments
• Telecommunications and data center component validation
• High-precision PDL and return-loss measurements
## Compatibility & Integration
Available in Model –202 and Model –201 configurations with specified measurement ranges and PDL performance tiers.
