The Fluke/Wavetek/Datron 1362 is a VXIbus-compatible, message-based 6.5-digit digital multimeter module engineered for high-precision automated test systems. This single-slot, C-size VXI module (revision 1.4 conformant) delivers selectable resolution from 4.5 to 6.5 digits with read rates up to 1000 per second at 4.5 digits, scaling to 5 readings per second at 6.5 digits for DC voltage. Internal memory stores 1 to 1000 readings, decoupling measurement speed from system controller bandwidth.
## Technical Specifications
**Measurement Ranges & Resolution**
• DC Voltage: 100 mV to 300 V in decade steps; 100 nV resolution at 6.5 digits
• AC Voltage (true RMS): 100 mV to 300 V in decade steps; 1 µV resolution at 5.5 digits
• Resistance: selectable resolution from 4.5 to 6.5 digits
• Optional modules: DC Current, AC Current (to 2 A with 5.5-digit resolution), and ratio measurements
**Performance**
• DCV accuracy (90 days, 23°C ± 5°C): 100 mV range ± (30 ppmR + 6 ppmFS); 1 V ± (20 ppmR + 3 ppmFS); 10 V ± (20 ppmR + 2 ppmFS); 100 V & 300 V ± (30 ppmR + 3 ppmFS)
• ACV frequency response: 10 Hz–40 Hz ± (0.4 %R + 0.1 %FS); 40 Hz–3 kHz ± (0.08 %R + 0.03 %FS); 40 Hz–20 kHz ± (0.035 %R + 0.01 %FS); 20 kHz–50 kHz ± (0.1 %R + 0.02 %FS)
• DCV input impedance: 10 GΩ (0.1 V–10 V); 10 MΩ (100 V & 300 V)
• CMRR: >146 dB DC; >80 dB + NMRR at 1–60 Hz
• NMRR: >54 dB at 50/60 Hz
• Overvoltage protection: 300 V RMS all ranges
**Triggering & Control**
• Dual trigger sources: internal system trigger or external TTL level
• Front-panel or VXI backplane trigger selection
• Measurement-complete trigger capability
• External trigger with programmable delay
• Autocal feature for external calibration without cover removal
**Programming & Integration**
• IEEE-488.2 programmable (1362, 1362MT)
• SCPI-compatible variants (1362S, 1362F)
• MATE/CIIL support (1362MT)
• VXI synchronous and asynchronous protocol compliance
**Operating Environment**
• Temperature range: 0°C to +50°C
## Key Features
• High read rates up to 1000 per second enable fast data acquisition
• Onboard 1000-reading buffer decouples measurement and readback timing
• Selectable resolution optimizes speed/accuracy tradeoff
• Multiple programming interfaces support diverse system architectures
• Programmable external calibration maintains accuracy without module removal
## Typical Applications
Automated production test, incoming inspection, environmental monitoring, precision component characterization, and integrated ATE systems requiring high-density multimeter modules.
## Compatibility & Integration
VXI specification 1.4 conformance ensures interoperability with standard VXI controllers. IEEE-488.2, SCPI, and CIIL command support accommodate legacy and modern system architectures.
