The Hewlett Packard HP 8514B S-Parameter Test Set is a dual-port network analysis instrument engineered for precise S-parameter characterization of RF and microwave components from 500 MHz to 20 GHz. The coupler-based architecture measures all four S-parameters of a two-port device without physical DUT reorientation, preserving calibration integrity and enabling in-circuit adjustments. Four integrated RF-to-IF converters eliminate the need for device reconnection between measurements, making it ideal for active devices and complex circuits where manipulation must be minimized.
Technical Specifications
• Frequency Range: 500 MHz to 20 GHz
• Port Configuration: Dual-port with coupler-based architecture; 3.5 mm male connectors with 7 mm test port connectors
• Impedance: 50 ohm nominal
• Operating Power Levels: +2 to -6 dBm; +2 to -29 dBm; -5 to -25 dBm (port 1 or 2)
• Maximum Power Handling: +43 dBm, +47 dBm (CW), +20 dBm, +2 dBm, or +13 dBm (20 W) depending on configuration
• Attenuation Control: Two 90 dB programmable step attenuators (0 to 90 dB in 10 dB steps) for incident power level control at both ports
• DC Bias Capability: Two integrated bias tees; 500 mA maximum, 40 Vdc maximum
– Key Features
• Four RF-to-IF converters enable complete S-parameter measurement from single connection
• Electronic RF switch for automated port selection
• Programmable attenuators for precise incident power management
• Bias tees support active device testing with external DC supply
• Separate reference channel developed for each incident port
– Typical Applications
• Active device characterization where mechanical repositioning is impractical
• Real-time network adjustment with full error-correction capability
• Integrated circuit and hybrid module testing
• In-situ measurement of temperature-sensitive or mechanically sensitive devices
– Compatibility & Integration
Designed for operation with the HP 8510 network analyzer system. Configurable with HP 8510C architecture.
