The HP/Agilent 33120A is a 15 MHz function and arbitrary waveform generator employing direct digital synthesis for stable, low-distortion signal generation across demanding test and design workflows. Option 001 adds a phase-lock assembly with TCXO timebase, delivering 4 ppm/yr frequency stability and external clock synchronization.
The instrument generates ten standard waveforms—sine, square, triangle, ramp, noise, sin(x)/x, exponential rise, exponential fall, cardiac, and DC—with sine and square outputs spanning 100 µHz to 15 MHz. Triangle and ramp waves reach 100 kHz. Arbitrary waveforms achieve 12-bit resolution at 40 MSa/s sample rate, supporting up to 16,000 points per waveform with non-volatile storage for four complete waveforms.
Technical Specifications
Frequency & Stability
• Sine/Square: 100 µHz to 15 MHz
• Triangle/Ramp: 100 µHz to 100 kHz
• White noise bandwidth: 10 MHz
• Frequency resolution: 10 µHz or 10 digits
• Accuracy: 10 ppm (90 days), 20 ppm (1 year)
• Temperature coefficient: < 2 ppm/°C
• Aging: < 10 ppm/yr
Spectral Purity (Sinewave)
• Harmonic distortion (DC–20 kHz): < 0.04% or -70 dBc
• Harmonic distortion (20 kHz–100 kHz): -60 dBc
• Harmonic distortion (100 kHz–1 MHz): -45 dBc
• Harmonic distortion (1 MHz–15 MHz): -35 dBc
• Spurious distortion (DC–15 MHz): < -65 dBc + 6 dB/octave above 1 MHz
• Phase noise: < -55 dBc in 30 kHz band
Output
• Amplitude: 1 mVpp to 20 Vpp (open circuit); 100 mVpp to 20 Vpp (50 Ω load)
• Offset: ≤ 2× peak-peak amplitude
• Output impedance: 50 Ω
• Squarewave rise/fall: < 20 ns
• Squarewave duty cycle: 20% to 80% (to 5 MHz)
Arbitrary Waveform
• Resolution: 12-bit
• Sample rate: 40 MSa/s
• Maximum length: 16,000 points
– Key Features
• Internal modulation: AM, FM, FSK, Burst with external source support for AM, FSK, Burst
• Linear and logarithmic sweep modes
• Phase offset control and external clock I/O
• Amplitude selectable in Vpp, Vrms, or dBm
– Compatibility & Integration
Full GPIB and RS-232 control with SCPI command support enables instrument automation and integration into test systems.
