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HP / Agilent 4155A Semiconductor Parameter Analyzers

SKU: 4155ACategories: Laboratory Measurement Instruments

Brand: HP / Agilent

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The HP/Agilent 4155A Semiconductor Parameter Analyzer is a precision instrument for comprehensive characterization of semiconductor devices and materials. It offers versatile measurement capabilities, including DC, AC, and pulse measurements, enabling thorough analysis of transistors, diodes, and integrated circuits. With its high accuracy and resolution, the 4155A provides detailed insights into device performance, making it ideal for research, development, and quality control applications in the semiconductor industry.

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Description
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The HP/Agilent 4155A Semiconductor Parameter Analyzer delivers precision DC and pulse characterization for transistors, diodes, and integrated circuits. Four Medium Power SMUs provide current sourcing and measurement from 10 fA to 100 mA across voltage ranges of 2 µV to 100 V, with 10 fA and 2 µV resolution. The instrument supports fully automated I-V sweep measurements in DC or pulse modes, interactive knob sweep operation, and synchronized stress/measure capability for device reliability assessment. Expandable architecture accommodates up to six SMUs via optional expander modules, enabling multi-device test configurations. Integrated pulse generation, voltage sourcing, and monitoring units support complex characterization workflows in research, development, and production quality control environments.

MPN	4155A
Voltage / Current Range	1 fA to 100 mA (general SMU); 2 µV to 200 V, 10 fA to 1 A (HPSMU); VSU: 20 V max, 10 fA to 100 mA (SMU); 1 µV to 100 V, 100 mA max; PGU: ±40 V, 2 µV to 100 V, 200 mA max
Brand Name	HP / Agilent