The HP/Agilent 54100D is a 1 GHz digitizing oscilloscope engineered for high-speed analog and digital design, test, and troubleshooting. It delivers advanced trigger capabilities, precise waveform capture, and deep analysis of complex signals through random repetitive sampling—enabling visualization of rare, narrow events and effective memory depth for elusive fault isolation. Two vertical channels plus two trigger inputs support flexible signal routing. Vertical magnification and waveform averaging achieve effective resolution up to approximately 10 bits, surfacing subtle signal perturbations invisible at native 7-bit resolution. The instrument’s 50 ps aperture jitter and 10 ps time interval resolution enable precise timing measurements, while 0.002% timebase accuracy and linearity ensure reliable long-duration captures. Programmable control integrates the 54100D into automated test systems. Pod-based input architecture accommodates HP 54002A, 54001A, and 54003A probes and pods for diverse measurement scenarios.
Technical Specifications
• Bandwidth: DC to 1 GHz
• Single-Shot Digitizing Rate: Up to 40 MSa/s
• Random Repetitive Sampling Rate: Up to 100 MSa/s effective
• Vertical Resolution (Native): 7 bits (1:128); effective up to ~10 bits with magnification and averaging
• Timebase Accuracy & Linearity: 0.002%
• Aperture Jitter: 50 ps
• Time Interval Resolution: 10 ps
• System Rise Time (with HP 54002A pod): <400 ps
• Vertical Channels: 2 with dedicated trigger inputs (Trigger 3, Trigger 4)
• Timebase Range: 100 ps/div to 1 s/div
• DC Offset Range: ±1.5× full-scale
• Vertical Magnifier: 1× to 16×; 0.5% steps
• Inter-Channel Delay Compensation: 10 ps steps, up to 10 ns
– Key Features
• Edge, logical pattern, and state trigger modes
• Selectable trigger sources from either vertical channel or dedicated trigger inputs
• DC accuracy to ±3% of full-scale (with 54002A pod) or ±6% (with 54001A/54003A pods)
• Delta voltage measurement accuracy ±1% of full-scale
• Multiple input pod support (54001A, 54002A, 54003A) with deflection factors ranging 10 mV/div to 10 V/div
– Typical Applications
Electrical characterization of high-speed logic and analog circuits; signal integrity validation; timing and jitter analysis; waveform capture of transient and repetitive events; automated production test integration.
– Compatibility & Integration
Programmable via standard interfaces for inclusion in automatic test systems. Compatible with HP/Agilent passive and active probes through dedicated input pods.
